Zobrazeno 1 - 3
of 3
pro vyhledávání: '"George Fenske"'
Autor:
Tomas Grejtak, Jeffrey A. Lacey, Miranda W. Kuns, Damon S. Hartley, David N. Thompson, George Fenske, Oyelayo O. Ajayi, Jun Qu
Publikováno v:
Wear. 522:204714
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::fac62e1d6c296b709b06609c25e27df3
https://doi.org/10.1016/j.wear.2023.204714
https://doi.org/10.1016/j.wear.2023.204714
Autor:
Stephen Busch, Mark Musculus, Lyle Pickett, Scott Skeen, John Dec, Isaac Ekoto, S. Goldsborough, Riccardo Scarcelli, James Szybist, Martin Wissink, William Pitz, Russell Whitesides, David Carrington, Jiajia Waters, K. Edwards, Charles Finney, Wael Elwasif, Toby Rockstroh, Muhsin Ameen, Tanmoy Chatterjee, Saumil Patel, Christopher Kolodziej, Hee Seong, Sibendu Som, Robert Wagner, Robert McCormick, Daniel Gaspar, Paul Bryan, C. Sluder, Magnus Sjöberg, Scott Curran, Derek Splitter, Christopher Powell, Charles Mueller, Brad Zigler, Gina Fioroni, Juliane Mueller, J. Bays, Josh Pihl, Melanie Moses-DeBusk, Matthew McNenly, Ajay Agrawal, Joshua Bittle, Robert Middleton, Ingmar Schoegl, Shyam Menon, Eric Petersen, Tianfeng Lu, Lisa Pfefferle, Yuan Xuan, Charles McEnally, Daniel Olsen, Hui Xu, Gregory Hampson, Anthony Marchese, Bret Windom, William Northrop, Thomas Briggs, Jr., Doug Longman, Sreshtha Majumdar, Calvin Thomas, Zhiming Gao, Yong Wang, Todd Toops, Vitaly Prikhodko, James Parks II, Bill Partridge, Abhi Karkamkar, Kenneth Rappé, Pascal Amar, Russell Zukouski, Jeff Girbach, Carl Hergart, Hanho Yun, Richard Roe, Robert Wang, Thomas Wallner, Arup Gangopadhyay, Ali Erdemir, Osman Eryilmaz, Stephen Hsu, Tim Cushing, Gefei Wu, George Fenske, Oyelayo Ajayi, Cinta Lorenzo-Martin, Robert Erck, Dileep Singh, Wenhua Yu, David France, Jun Qu, Xin He, Huimin Luo, Teresa Mathews, Harry Meyer III, Chanaka Kumara, Lelia Cosimbescu, James Van de Ven, Perry Li, Thomas Chase, Paul Michael
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5f5eb52e920d9f8fd6b56203126cdb61
https://doi.org/10.2172/1637434
https://doi.org/10.2172/1637434
Publikováno v:
Nuclear Instruments and Methods. 170:465-470
Transition electron microscopy has been used to study the effect of dose on the depth distribution of cavities (voids or bubbles) and dislocation damage in nickel irradiated at 500°C, with 500 keV 4 He + ions. The diameter, number density and volume
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::00b89e2670c1cf52ea08e80fb9b2bde6
https://doi.org/10.1016/0029-554x(80)91058-7
https://doi.org/10.1016/0029-554x(80)91058-7