Zobrazeno 1 - 4
of 4
pro vyhledávání: '"George E. Rudgers"'
Publikováno v:
2011 IEEE/SEMI Advanced Semiconductor Manufacturing Conference.
In this paper we present an early detection mechanism for semiconductor circuit yield prediction and tracking. Several discrete devices used as components of functional circuits have been examined by their first-metal level test data and correlated t
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6a04237035535353c6b9e0dc020b5ce3
https://doi.org/10.1109/asmc.2011.5898160
https://doi.org/10.1109/asmc.2011.5898160
Publikováno v:
ITC
Process scaling and the need for smaller SRAM cells challenges process technologies to make millions of robust and reliable bitline contacts on a single chip. Another challenge is to identify marginal, resistive and unreliable bitline contacts given
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9d9e73261e84ddb98703af0ff1fcde95
https://doi.org/10.1109/test.2001.966699
https://doi.org/10.1109/test.2001.966699
Publikováno v:
Proceedings International Test Conference 2001 (Cat. No.01CH37260); 2001, p776-782, 7p