Zobrazeno 1 - 10
of 15
pro vyhledávání: '"George C. John"'
Publikováno v:
Physical Review B. 58:1158-1161
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3693de6ab4c19b00774204b9588e6357
https://doi.org/10.1103/physrevb.58.1158
https://doi.org/10.1103/physrevb.58.1158
Autor:
Vijay A. Singh, George C. John
Publikováno v:
Physical Review B. 56:4638-4641
We investigate the diffusion-induced nucleation model for the formation of porous silicon. We show that simulations based on this model can explain experimental features such as (i) a constant porosity profile, (ii) a planar film front, and (iii) the
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::69018f54b7ec6dd1aee74f8276066a63
https://doi.org/10.1103/physrevb.56.4638
https://doi.org/10.1103/physrevb.56.4638
Autor:
Vijay A. Singh, George C. John
Publikováno v:
Solid State Phenomena. 55:62-67
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b773c9a2222c1679b03e521872dc9da5
https://doi.org/10.4028/www.scientific.net/ssp.55.62
https://doi.org/10.4028/www.scientific.net/ssp.55.62
Autor:
George C. John, Vijay A. Singh
Publikováno v:
Physical Review B. 54:4416-4419
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::93ae9915a6acd4251d0f3cacc82b84f5
https://doi.org/10.1103/physrevb.54.4416
https://doi.org/10.1103/physrevb.54.4416
Autor:
George C. John, Vijay A. Singh
Publikováno v:
Physics Reports. 263:93-151
Porous silicon has attracted considerable scientific interest ever since the recent discovery of visible photoluminescence. We present a review of the theoretical work done on this material. We describe the classical theories and computer simulations
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a8a7053caa1d62b967e81624492a7d2a
https://doi.org/10.1016/0370-1573(95)00052-4
https://doi.org/10.1016/0370-1573(95)00052-4
Autor:
Vijay A. Singh, George C. John
Publikováno v:
International Journal of Modern Physics C. :67-76
The electron propagator in the Aharonov-Bohm effect is investigated using the Feynman path integral formalism. The calculation of the propagator is effected using a variation of the Metropolis Monte Carlo algorithm. Unlike “exact” calculations, o
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5e435e181393b655d4d1a8a80d386aa7
https://doi.org/10.1142/s012918319500006x
https://doi.org/10.1142/s012918319500006x
Publikováno v:
Digital Photography
In this work, LED based flash solutions are evaluated for use in a camera phone application. The performance of a given flash solution is measured in terms of color accuracy and signal to noise ratio (SNR), both of which are standard test methods use
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::16095c1c8331a7fe2330f08b73a22633
https://doi.org/10.1117/12.876666
https://doi.org/10.1117/12.876666
Publikováno v:
Digital Photography
Due to the demanding size and cost constraints of camera phones, the mobile imaging industry needs to address several key challenges in order to achieve the quality of a digital still camera. Minimizing camera-motion introduced image blur is one of t
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9b9ef99e1e42b8e8c8e000ac47668275
https://doi.org/10.1117/12.706974
https://doi.org/10.1117/12.706974
Autor:
Robert W. Owen, Karsten S. Weber, Xiaolong Dai, William R. Usry, James S. Goddard, Tracy M. Bahm, Christopher Marek, Allen N. Su, George C. John, Judd M. Gilbert, Michael W. Mayo, Matthew D. Chidley, Michael L. Jones, Martin A. Hunt, Mark A. Schulze, C. E. Thomas, J.H. Price, Randall G. Smith, Edgar Voelkl, Bichuan Shen, David A Rasmussen, Joel D. Hickson, Ayman M. El-Khashab, Kenneth W. Tobin, Louis J. Schaefer, Philip R. Bingham, Gregory R. Hanson, Larry R. Baylor, Robert J. Delahanty, Kathy W. Hylton
Publikováno v:
AIP Conference Proceedings.
Direct to Digital Holography (DDH) has been developed as a semiconductor wafer inspection tool and in particular as a tool for seeing defects in high aspect ratio (HAR) structures on semiconductor wafers and also for seeing partial‐height defects.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ceea6527828de20a7d2c24d614924e79
https://doi.org/10.1063/1.1622480
https://doi.org/10.1063/1.1622480
Autor:
Larry R. Baylor, Robert J. Delahanty, Louis J. Schaefer, Philip R. Bingham, Kathy W. Hylton, Kenneth W. Tobin, Gregory R. Hanson, George C. John, Long Dai, Michael L. Jones, Joel D. Hickson, J.H. Price, Ayman M. El-Khashab, Michael W. Mayo, Christopher J. Doti, Robert L. Fisher, Mark A. Schulze, Thomas R. Scheidt, Martin A. Hunt, Judd M. Gilbert, Robert W. Owen, Paul G. Jones, William R. Usry, C. E. Thomas, Matt Chidley, Philip D. Schumaker, Tracy M. Bahm, Allen N. Su, Steven W. Burns, Karsten S. Weber, Bichuan Shen, Ian M. Mcmackin, Dave R. Patek, Ken R. Macdonald, James S. Goddard, David A Rasmussen, Randall G. Smith, Edgar Voelkl
Publikováno v:
SPIE Proceedings.
A method for recording true holograms (not holographic interferometry) directly to a digital video medium in a single image has been invented. This technology makes the amplitude and phase for every pixel of the target object wave available. Since ph
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::fb53a81fb019ee0d7db5d3071ca13d6e
https://doi.org/10.1117/12.475659
https://doi.org/10.1117/12.475659