Zobrazeno 1 - 10
of 89
pro vyhledávání: '"Georg Pelz"'
Autor:
Alecsandra Rusu, Emilian David, Vasile Grosu, Marina Topa, Andi Buzo, Bianca Carbunescu, Georg Pelz
Publikováno v:
IEEE Access, Vol 12, Pp 136436-136450 (2024)
This paper presents an adaptive pre-silicon integrated circuit verification algorithm that incorporates a machine learning algorithm. This approach can overcome the traditional corner-based process-voltage-temperature verification limitations conside
Externí odkaz:
https://doaj.org/article/09a7adbb39e44090994795f77cd37254
Publikováno v:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::6314b49858b5b9cf327f0871fa872464
https://doi.org/10.1109/tcad.2021.3054804
https://doi.org/10.1109/tcad.2021.3054804
Autor:
Octavian Pascu, Catalin Visan, Marius Stanescu, Horia Cucu, Cristian Diaconu, Andi Buzo, Georg Pelz
Publikováno v:
2022 International Semiconductor Conference (CAS).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3acd1208e070f27ae24b69823b954884
https://doi.org/10.1109/cas56377.2022.9934178
https://doi.org/10.1109/cas56377.2022.9934178
Publikováno v:
2022 International Semiconductor Conference (CAS).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::cb08834eb980456af55e916f8b6c0fcb
https://doi.org/10.1109/cas56377.2022.9934364
https://doi.org/10.1109/cas56377.2022.9934364
Publikováno v:
2022 IEEE International Test Conference (ITC).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::782182ceaa4661991414fdcee6fbf827
https://doi.org/10.1109/itc50671.2022.00072
https://doi.org/10.1109/itc50671.2022.00072
Publikováno v:
2022 IEEE International Test Conference India (ITC India).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::060a1dc18b1ba3cc683221f078efdeae
https://doi.org/10.1109/itcindia202255192.2022.9854542
https://doi.org/10.1109/itcindia202255192.2022.9854542
Autor:
Cristian Manolache, Alexandru Caranica, Marius Stanescu, Horia Cucu, Andi Buzo, Cristian Diaconu, Georg Pelz
Publikováno v:
2022 18th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::182fe25f3fef7f460a7932bb4278046c
https://doi.org/10.1109/smacd55068.2022.9816209
https://doi.org/10.1109/smacd55068.2022.9816209
Publikováno v:
2022 6th IEEE Electron Devices Technology & Manufacturing Conference (EDTM).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::cbdcb90c0e5d26ee4daeb0d967073c8f
https://doi.org/10.1109/edtm53872.2022.9798263
https://doi.org/10.1109/edtm53872.2022.9798263
Publikováno v:
2021 28th IEEE International Conference on Electronics, Circuits, and Systems (ICECS).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5e1b454b6da407efb04598b6d6f99255
https://doi.org/10.1109/icecs53924.2021.9665517
https://doi.org/10.1109/icecs53924.2021.9665517
Publikováno v:
2021 28th IEEE International Conference on Electronics, Circuits, and Systems (ICECS).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9bf87474f278111da457edf967e567de
https://doi.org/10.1109/icecs53924.2021.9665466
https://doi.org/10.1109/icecs53924.2021.9665466