Zobrazeno 1 - 10 of 85 pro vyhledávání: '"Gensterblum, G."'
1
Akademický článek
Structural defects and epitaxial rotation of C60 and C70(111) films on GeS(001).
Autor: Bernaerts, D., Tendeloo, G. Van, Amelinckx, S., Hevesi, K., Gensterblum, G., Yu, L. M., Pireaux, J.-J., Grey, F., Bohr, J.
Publikováno v: Journal of Applied Physics; 9/15/1996, Vol. 80 Issue 6, p3310, 9p
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2
Vibrational study of C-60 overlayers on H/Si(111)-(1x1)
Autor: Dumas, P., Gruyters, M., Rudolf, P., He, Y., Yu, L.-M., Gensterblum, G., Caudano, R., Chabal, Y.J.
Publikováno v: Surface Science, 368(1-3), 330-336. ELSEVIER SCIENCE BV
We have studied the vibrational properties of thin C60 overlayers deposited on ideally H-terminated Si(111) surfaces, by multiple infrared reflection and high-resolution electron energy-loss spectroscopies. We find that the Si-H interface remains int
Externí odkaz: https://explore.openaire.eu/search/publication?articleId=narcis______::ee9fd397f8cfa90edca61845ce1390c7
https://research.rug.nl/en/publications/a883e934-3de8-4dba-8e38-fd339b813327
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3
Electronic-transitions and excitations in solid C-70 studied by EELS and XPS c-1s satellite structures
Autor: Han, Bo-ying, Yu, Li-ming, Hevesi, K., Gensterblum, G., Rudolf, P., Pireaux, J.-J., Thiry, P.A., Caudano, R., Lambin, Ph., Lucas, A.A.
Publikováno v: Physical Review B, 51(11), 7179-7185. AMER PHYSICAL SOC
The electronic transition and excitation properties of highly ordered C70 films have been studied by reflection electron-energy-loss spectroscopy (EELS) and x-ray photoemission spectroscopy (XPS) C 1s satellite structures. The EELS study revealed a t
Externí odkaz: https://explore.openaire.eu/search/publication?articleId=narcis______::25e67a1214d48887b3dd4638ff3666e2
https://research.rug.nl/en/publications/a7c60dd8-87aa-44b8-993e-4016b6481121
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4
Comment on 'Adsorption of C60 on Ta(110): Photoemission and C K-edge studies'
Autor: Rudolf, P., Gensterblum, G.
Publikováno v: Physical Review B, 50(16), 12215-12217. AMER PHYSICAL SOC
Recently, ultrathin C60 films on a Ta(110) surface were characterized by photoemission and C K-edge studies. It was concluded that some fraction of the fullerene overlayer decomposes on the clean metal surface resulting in a thin layer of carbon betw
Externí odkaz: https://explore.openaire.eu/search/publication?articleId=narcis______::4cd82664e1a1b005aa6d8dbcc00bedf7
https://research.rug.nl/en/publications/a622dc2d-3ea2-4b3a-9469-6fa81f95038b
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8
Akademický článek
Heteroepitaxial growth of C70 films on MoS2(0001) and their characterization by low energy electron diffraction and photoelectron spectroscopy.
Autor: Han, Bo-ying, Hevesi, K., Yu, Li-ming, Gensterblum, G., Pireaux, J.-J., Thiry, P. A., Caudano, R.
Publikováno v: Journal of Vacuum Science & Technology: Part A-Vacuums, Surfaces & Films; 1995, Vol. 13 Issue 3, p1036-1039, 4p
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9
Periodical
Scanning and friction-force microscopy of thin C60 films on GeS(001)
Autor: Allers, W., Schwarz, U. D., Gensterblum, G., Wiesendanger, R.
Publikováno v: Applied Physics A: Materials Science & Processing; July 1994, Vol. 59 Issue: 1 p11-15, 5p
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10
Periodical
C60 growth on Si(100), GaSe(0001) and GeS(001)
Autor: Gensterblum, G., Yu, L. -M., Pireaux, J. -J., Thiry, P. A., Caudano, R., Themlin, J. -M., Bouzidi, S., Coletti, F., Debever, J. -M.
Publikováno v: Applied Physics A: Materials Science & Processing; March 1993, Vol. 56 Issue: 3 p175-183, 9p
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