Methodology to Test Automotive Electrical Components to Wideband Pulse Interferences

Autor: Thomas Picon, Geneviève Duchamp, Tristan Dubois, Marco Klingler

Publikováno v: Proceedings of EMC Europe 2019
Proceedings of EMC Europe 2019, 2019, Barcelona, Spain
IEEE Trans. On EMC
IEEE Trans. On EMC, 2019
IEEE Transactions on Electromagnetic Compatibility
IEEE Transactions on Electromagnetic Compatibility, Institute of Electrical and Electronics Engineers, 2019
IEEE Transactions on Electromagnetic Compatibility, 2019

This article presents a global methodology to test components (equipment) on table test bench with representative interferences found on vehicle simulation in case of wideband modulated pulse interferences. The proposed method consists, first, of usi

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::fd4f763d1015ac100e9c50be6a5192ae
https://doi.org/10.1109/temc.2019.2960082

Moisture diffusion in plasma-enhanced chemical vapor deposition dielectrics characterized with three techniques under clean room conditions

Autor: Du Vo-Thanh, Catherine Chaton, Névine Rochat, Geneviève Duchamp, G. Imbert, Vivien Cartailler, Hélène Fremont, Daniel Benoit

Publikováno v: Thin Solid Films
Thin Solid Films, Elsevier, 2020, 698, pp.137874-. ⟨10.1016/j.tsf.2020.137874⟩
Thin Solid Films, 2020, 698, pp.137874-. ⟨10.1016/j.tsf.2020.137874⟩
Thin Solid Films, 2020, ⟨10.1016/j.tsf.2020.137874⟩

Absorption of moisture by thin dielectric materials alters their properties and can cause several reliability issues. Even at standard room temperature and low humidity level, some dielectric materials are sensitive to moisture. In this study, moistu

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::942bb62d4d82ad1d6f978f756e37f5f3
https://hal.archives-ouvertes.fr/hal-03489597

Effects of HPEM stress on GaAs low-noise amplifier from circuit to component scale

Autor: Tristan Dubois, Patrick Hoffmann, Geneviève Duchamp, M. Girard

Publikováno v: Microelectronics Reliability
Microelectronics Reliability, 2018, 88-90, pp.914-919. ⟨10.1016/j.microrel.2018.07.108⟩
Microelectronics Reliability, Elsevier, 2018, 88-90, pp.914-919. ⟨10.1016/j.microrel.2018.07.108⟩

International audience; This paper presents a study of High Power Electromagnetics (HPEM) stress effects on a GaAs (Gallium Arsenide) low-noise amplifier (LNA). This work aims to evaluate such electrical stress effect from circuit to component scale

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::2069656e3471998dc40f0cdaa5fa29bf
https://doi.org/10.1016/j.microrel.2018.07.108

Moisture Diffusion in Dense SiO2 and Ultra Low k Integrated Stacks

Autor: G. Imbert, Catherine Chaton, Marie-Astrid Pin, Jean Baptiste Moulard, D. Ney, Veronique Guyader, P. Lamontagne, Geneviève Duchamp, Hélène Fremont, Daniel Benoit, Vivien Cartailler, Mustapha Rafik, Marc Juhel

Publikováno v: 2019 IEEE International Integrated Reliability Workshop (IIRW).

The impact of moisture diffusion on two types of fully integrated stacks was investigated. One of them with dense SiO 2 layers and the other with ultra low k (ULK), both of which are predominantly used in BEOL (Back End of Line) as inter layer dielec

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::54352de11f340355c948bf3f652d8d46
https://doi.org/10.1109/iirw47491.2019.8989874

Effects of Process-Voltage-Temperature (PVT) Variations on Low-Side MOSFET circuit Conducted Emission

Autor: Nicolas Baptistat, Geneviève Duchamp, Kamel Abouda, Tristan Dubois

Publikováno v: Proceedings of EMC Compo 2019
Proceedings of EMC Compo 2019, 2019, Hangzhou, China

In electronic circuits, signal switching creates significant harmonic content in the frequency domain. Designers are used to study this content through simulation and measurement to avoid Electromagnetic Compatibility (EMC) issues by minimising the c

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::fa7f7d3f1872f288b54bea684b0cbacb
https://hal.archives-ouvertes.fr/hal-02515500