Zobrazeno 1 - 10
of 18
pro vyhledávání: '"Geliztle A. Parra-Escamilla"'
Publikováno v:
Heliyon, Vol 9, Iss 6, Pp e16771- (2023)
We propose a demodulation algorithm based on the calculus of the complex Fourier coefficients; we used a dual rotating polarizer-analyzer polarimeter to show the feasibility of our proposal. Our demodulation algorithm considers the frequency response
Externí odkaz:
https://doaj.org/article/95bb4852473e4785a62222314e98474f
Publikováno v:
Optical Technology and Measurement for Industrial Applications Conference 2022.
Autor:
Guillermo García Torales, Geliztle A. Parra Escamilla, Francisco J. Cervantes Lozano, Jorge L. Flores Núñez, David Ignacio Serrano Garcia
Publikováno v:
Optical Technology and Measurement for Industrial Applications Conference 2021.
We present a demodulation approach for a rotating polarizer-analyzer polarimeter dedicated to retardance measurements. Through the Mueller matrix approach and the theoretical Fourier transform, we developed a demodulation algorithm considering the tw
Autor:
Noel Ivan Toto Arellano, Geliztle A. Parra-Escamilla, Yanely B. Machuca, David I. Serrano-García, Jorge L. Flores
Publikováno v:
Infrared Remote Sensing and Instrumentation XXIX.
We propose a polarizing Michelson interferometer coupled to a pixelated polarizing camera to visualize dynamic phase objects. Considering the capabilities of the polarizing camera, we employed a temporal phase unwrapping algorithm to process informat
Autor:
J. M. Islas-Islas, Geliztle A. Parra-Escamilla, Gustavo Rodriguez-Zurita, L. García Lechuga, J. G. Ortega-Mendoza, David I. Serrano-García, V. H. Flores-Muñoz, Noel-Ivan Toto-Arellano, Amalia Martínez-García, A. Montes Pérez
Publikováno v:
Optical Review. 26:231-240
We developed simultaneous phase-shifting system based on a Mach–Zehnder interferometer and a replicating system integrated by a Michelson configuration and a cube beam splitter. The system is capable to obtain four simultaneous interferograms in a
Autor:
Noel-Ivan Toto-Arellano, David I. Serrano-García, Geliztle A. Parra-Escamilla, Gustavo Rodriguez-Zurita, Areli Montes Pérez
Publikováno v:
Optics Communications. 429:80-87
We developed an interferometric system capable of generate four interferograms simultaneously with independent phase shifts employing modulation by polarization. The proposed system consists of three coupled interferometers: A polarized Mach–Zehnde
Autor:
Azael Mora-Nuñez, H. Santiago-Hernández, Olivier Pottiez, J. Flores Nuñez, Geliztle A. Parra-Escamilla, Manuel Durán-Sánchez, M. S. B. Bravo Medina, Guillermo Garcia-Torales, D. I. Serrano Garcia, Baldemar Ibarra-Escamilla
Publikováno v:
Infrared Remote Sensing and Instrumentation XXVIII.
We propose to use the fast Fourier transformation (FFT) to analyze the spectral data of passively mode-locked fiber lasers, with the purpose of characterizing and classifying the different pulsed regimes arising in these lasers. The results show temp
Autor:
Geliztle A. Parra-Escamilla, Francisco J. Cervantes Lozano, David I. Serrano-García, H. Santiago-Hernández, Jorge L. Flores, Guillermo Garcia-Torales
Publikováno v:
Infrared Remote Sensing and Instrumentation XXVIII.
We present a calibration approach for rotating polarizer-analyzer polarimeter dedicated to retardance measurements. The rotating polarizer-analyzer polarimeter is based on retrieving a partial Mueller matrix measurement of a transparent sample to be
Publikováno v:
Optics Communications. 390:57-60
We present a three-dimensional surface measurement system using imaging fiber endoscope and the measurement is based on the focus technique in uniaxial configuration. The surface height variation of the sample is retrieved by taking into account the
Autor:
Guillermo García Torales, Jorge L. Flores, Francisco J. Cervantes Lozano, Humberto Macias-Mendoza, Héctor Hernández, David I. Serrano-García, Azael Mora-Nuñez, Geliztle A. Parra Escamilla
Publikováno v:
Polarization Science and Remote Sensing IX.
In this work, we proposed the usage of a rotating polarizer-analyzer polarimeter to retrieve retardance parameters of a sample by treating it as an elliptical retarder that can be characterized by three parameters: total retardance, fast axis orienta