Zobrazeno 1 - 10
of 156
pro vyhledávání: '"Geert Hellings"'
Autor:
Hsiao-Hsuan Liu, Shairfe M. Salahuddin, Boon Teik Chan, Pieter Schuddinck, Yang Xiang, Geert Hellings, Pieter Weckx, Julien Ryckaert, Francky Catthoor
Publikováno v:
IEEE Transactions on Electron Devices. 70:883-890
Autor:
Dawit Burusie Abdi, Shairfe M. Salahuddin, Juergen Boemmels, Edouard Giacomin, Pieter Weckx, Julien Ryckaert, Geert Hellings, Francky Catthoor
Publikováno v:
IEEE Transactions on Circuits and Systems I: Regular Papers. :1-10
Autor:
Giuliano Sisto, Odysseas Zografos, Bilal Chehab, Naveen Kakarla, Yang Xiang, Dragomir Milojevic, Pieter Weckx, Geert Hellings, Julien Ryckaert
Publikováno v:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 30:1497-1506
Autor:
S. S. Teja Nibhanupudi, Divya Prasad, Shidhartha Das, Odysseas Zografos, Alex Robinson, Anshul Gupta, Alessio Spessot, Peter Debacker, Diederik Verkest, Julien Ryckaert, Geert Hellings, James Myers, Brian Cline, Jaydeep P. Kulkarni
Publikováno v:
IEEE Transactions on Electron Devices. 69:4453-4459
Autor:
Gioele Mirabelli, Anne Vandooren, Cesar Roda Neve, Victor Vega Gonzalez, Hans Mertens, Anita Farokhnejad, Pieter Schuddinck, Gayle Murdoch, Shairfe Muhammad Salahuddin, Odysseas Zografos, Lars Ragnarsson, Pieter Weckx, Zsolt Tokei, Geert Hellings, Julien Ryckaert
Publikováno v:
DTCO and Computational Patterning II.
Autor:
Gioele Mirabelli, Pieter Schuddinck, Hsiao-Hsuan Liu, Sheng Yang, Odysseas Zografos, Shairfe Muhammad Salahuddin, Pieter Weckx, Gaspard Hiblot, Geert Hellings, Julien Ryckaert
Publikováno v:
DTCO and Computational Patterning II.
Publikováno v:
DTCO and Computational Patterning II.
Autor:
Hsiao-Hsuan Liu, Shairfe Muhammad . Salahuddin, Boon Teik Chan, Pieter Schuddinck, Yang Xiang, Pieter Weckx, Geert Hellings, Francky Catthoor
Publikováno v:
DTCO and Computational Patterning II.
Autor:
Michiel Vandemaele, Ben Kaczer, Erik Bury, Jacopo Franco, Adrian Chasin, Alexander Makarov, Hans Mertens, Geert Hellings, Guido Groeseneken
Publikováno v:
2023 IEEE International Reliability Physics Symposium (IRPS).
Autor:
Wen-Chieh Chen, Shih-Hung Chen, Thomas Chiarella, Geert Hellings, Dimitri Linten, Guido Groeseneken
ispartof: IEEE TRANSACTIONS ON ELECTRON DEVICES vol:69 issue:9 pages:5357-5362 status: published
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::baf47d95bc0066be1470d30ad0a7478f
https://lirias.kuleuven.be/handle/20.500.12942/719378
https://lirias.kuleuven.be/handle/20.500.12942/719378