Zobrazeno 1 - 4
of 4
pro vyhledávání: '"Geduld Dieter"'
Autor:
Ndlovu Ntombizikhona, Maleka Peane, Bielewicz Marcin, Buffler Andy, Smit Frederick, Geduld Dieter, Mhlongo Sizwe, Lamula Thobeka, Dyosi Siyabulela, Nchodu Rudolph, Wiedeking Mathis, Ntshangase Sifiso, Strugalska-Gola Elzbieta, Herbert Mark, Masondo Vusumuzi
Publikováno v:
EPJ Web of Conferences, Vol 239, p 01025 (2020)
There are few experimental data for neutron cross-section libraries in (n,xn) reactions for various materials at energies above 20 MeV. For neutron energies above 20 MeV, these set of (n,xn) reactions are important for neutron fluence monitoring and
Externí odkaz:
https://doaj.org/article/7b0b1b77417b49b1ba83045c4c32c988
Autor:
Ndlovu, Ntombizikhona, Boso, Alberto, Buffler, Andy, Geduld, Dieter, Hutton, Tanya, Lacoste, Véronique, Leadbeater, Tom, Maleka, Peane, Smit, Frederick
Publikováno v:
22nd International Conference on Cyclotrons and their Applications (CYC2019)
22nd International Conference on Cyclotrons and their Applications (CYC2019), Sep 2019, Cape Town, South Africa. pp.TUP012, ⟨10.18429/JACoW-Cyclotrons2019-TUP012⟩
22nd International Conference on Cyclotrons and their Applications (CYC2019), Sep 2019, Cape Town, South Africa. pp.TUP012, ⟨10.18429/JACoW-Cyclotrons2019-TUP012⟩
Quasi-monoenergetic neutron beams are typically produced at the iThemba LABS fast neutron beam facility by the 7Li(p, xn) or 9Be(p, xn) reactions. With the proton beams available from the separated sector cyclotron, the neutron energy range from abou
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::abd93245767f6e8ed78b11c1e21e2a8b
Autor:
Jeyasugiththan, Jeyasingam, Nieto Camero, Jaime, Symons, Julyan, Jones, Pete, Buffler, Andy, Geduld, Dieter, Peterson, Stephen W
Publikováno v:
Biomedical Physics & Engineering Express; Mar2021, Vol. 7 Issue 2, p1-14, 14p
Autor:
Geduld, Dieter Rudi
It is now generally recognized that unless an alternative for aluminium is found the resistivity of the metal interconnects will soon limit device performance. Copper, with its low resistivity and greater resistance to electromigration is one of the
Externí odkaz:
http://hdl.handle.net/11427/18431