Zobrazeno 1 - 6
of 6
pro vyhledávání: '"Gayathri Raghavendra"'
Publikováno v:
SPIE Proceedings.
The BCT solution is an automatic correction for systematic offset built into the PCS product based on calibration from 2-5 wafers. This paper explores the validity of a predictive model for process control for use by manufacturers of semiconductor de
Publikováno v:
SPIE Proceedings.
The need for process control in the semiconductor industry has been established and the benefits have been demonstrated. In the past, process control applications in the semiconductor manufacturing have relied on univariable control schemes. In the c
Autor:
Kenneth C. Johnson, Makoto Miyagi, Hsu-Ting Huang, Cristina Cheung, Apo Sezginer, Fred E. Stanke, Michelle L. Zimmerman, Bhanwar Singh, Gayathri Raghavendra
Publikováno v:
SPIE Proceedings.
Scatterometry provides a new, vibration-tolerant technique of overlay metrology. Gauge repeatability and reproducibility is improved by an order of magnitude over imaging-based overlay metrology. To measure the overlay of patterned layers A and B by
Autor:
BRITTO, DEV T., KRONZUCKER, HERBERT J.
Publikováno v:
Plant, Cell & Environment; Nov2005, Vol. 28 Issue 11, p1396-1409, 14p, 4 Diagrams, 1 Chart
Graph data modeling and querying arises in many practical application domains such as social and biological networks where the primary focus is on concepts and their relationships and the rich patterns in these complex webs of interconnectivity. In t
Graph data modeling and querying arises in many practical application domains such as social and biological networks where the primary focus is on concepts and their relationships and the rich patterns in these complex webs of interconnectivity. In t