Zobrazeno 1 - 10
of 90
pro vyhledávání: '"Gavens, A.J."'
Publikováno v:
In Acta Materialia 2003 51(13):3871-3884
An X-ray study of residual stresses and bending stresses in free-standing Nb/Nb 5Si 3 microlaminates
Publikováno v:
In Acta Materialia 2000 48(13):3533-3543
Autor:
Gavens, A.J., Van Heerden, D.
Publikováno v:
Journal of Applied Physics; 2/1/2000, Vol. 87 Issue 3, p1255, 9p, 3 Diagrams, 2 Charts, 9 Graphs
Publikováno v:
In Materials Science & Engineering A 1999 261(1):217-222
Publikováno v:
In Materials Science & Engineering A 1999 261(1):212-216
Publikováno v:
Journal of Applied Physics; 8/1/1997, Vol. 82 Issue 3, p1178, 11p, 3 Black and White Photographs, 7 Diagrams, 1 Chart, 11 Graphs
Autor:
Camerini, Isabel Giron1 (AUTHOR) isabelgc@aluno.puc-rio.br, de Souza, Luis Paulo Brasil1 (AUTHOR), Gouvea, Paula Medeiros Proença1 (AUTHOR), Braga, Arthur Martins Barbosa1 (AUTHOR)
Publikováno v:
Sensors (14248220). Sep2024, Vol. 24 Issue 17, p5561. 20p.
Autor:
Shoudy, D.A., Saulnier, G.J., Scarton, H.A., Das, P.K., Roa-Prada, S., Ashdown, J.D., Gavens, A.J.
Publikováno v:
2007 IEEE Ultrasonics Symposium Proceedings; 2007, p1848-1853, 6p
Autor:
Pereira, Raphael B.1 (AUTHOR) raphael@pwm.com.br, Braga, Arthur M. B.2 (AUTHOR) abraga@puc-rio.br, Kubrusly, Alan C.1 (AUTHOR) alan@cpti.cetuc.puc-rio.br
Publikováno v:
Sensors (14248220). May2023, Vol. 23 Issue 10, p4697. 15p.
Autor:
Schaechtle, Thomas1 (AUTHOR) thomas.schaechtle@imtek.uni-freiburg.de, Aftab, Taimur1 (AUTHOR), Reindl, Leonhard M.1 (AUTHOR), Rupitsch, Stefan J.1 (AUTHOR)
Publikováno v:
Sensors (14248220). Feb2023, Vol. 23 Issue 4, p2043. 13p.