Zobrazeno 1 - 1
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pro vyhledávání: '"Gate sizing [Tamaño de la puerta]"'
Autor:
ANDRES FELIPE GOMEZ CHACON
Publikováno v:
Instituto Nacional de Astrofísica, Óptica y Electrónica
INAOE
Repositorio Institucional del INAOE
INAOE
Repositorio Institucional del INAOE
Reliability degradation due to transistor aging is a major challenge in the design of digital integrated circuits for current and future technology nodes. Bias Temperature Instability (BTI) is the dominant aging mechanisms in digital circuits. BTI gr
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od______3056::63827062bbbb54efe50ff3b217f9efbb
http://inaoe.repositorioinstitucional.mx/jspui/handle/1009/845
http://inaoe.repositorioinstitucional.mx/jspui/handle/1009/845
