Zobrazeno 1 - 10
of 25
pro vyhledávání: '"Gaskell, KJ"'
Publikováno v:
Journal of Physics Energy, vol 3, iss 1
JPhys Energy, vol 3, iss 1
JPhys Energy, vol 3, iss 1
In operando, ambient-pressure x-ray photoelectron spectroscopy (AP-XPS) has been used to evaluate surface states of gadolinia-doped ceria (GDC) thin-film electrodes during H2 oxidation and H2O electrolysis, on yttria-stabilized zirconia (YSZ)-support
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::9f176e951c1f5985211666719e33d6c1
https://escholarship.org/uc/item/2dk7j4k4
https://escholarship.org/uc/item/2dk7j4k4
Akademický článek
Tento výsledek nelze pro nepřihlášené uživatele zobrazit.
K zobrazení výsledku je třeba se přihlásit.
K zobrazení výsledku je třeba se přihlásit.
Akademický článek
Tento výsledek nelze pro nepřihlášené uživatele zobrazit.
K zobrazení výsledku je třeba se přihlásit.
K zobrazení výsledku je třeba se přihlásit.
Publikováno v:
ACS omega [ACS Omega] 2021 Aug 18; Vol. 6 (34), pp. 22463-22465. Date of Electronic Publication: 2021 Aug 18 (Print Publication: 2021).
Autor:
Zewde B; Department of Chemistry, Howard University, Washington, D.C. 20059, United States., Atoyebi O; Department of Chemistry, Howard University, Washington, D.C. 20059, United States., Gugssa A; Department of Biology, Howard University, Washington, D.C. 20059, United States., Gaskell KJ; Department of Chemistry, University of Maryland College Park, College Park, Maryland 20742, United States., Raghavan D; Department of Chemistry, Howard University, Washington, D.C. 20059, United States.
Publikováno v:
ACS omega [ACS Omega] 2021 Apr 22; Vol. 6 (17), pp. 11614-11627. Date of Electronic Publication: 2021 Apr 22 (Print Publication: 2021).
Autor:
Reed BP; National Physical Laboratory, Hampton Road, Teddington TW11 0LW, United Kingdom., Cant DJH; National Physical Laboratory, Hampton Road, Teddington TW11 0LW, United Kingdom., Spencer SJ; National Physical Laboratory, Hampton Road, Teddington TW11 0LW, United Kingdom., Carmona-Carmona AJ; CINVESTAV-Unidad Queretaro, Queretaro 76230, Mexico., Bushell A; Thermo Fisher Scientific (Surface Analysis), East Grinstead RH19 1XZ, United Kingdom., Herrera-Gómez A; CINVESTAV-Unidad Queretaro, Queretaro 76230, Mexico., Kurokawa A; National Metrology Institute of Japan (NMIJ), National Institute of Advanced Industrial Science and Technology (AIST), 1-1-1 Higashi, Tsukuba, Ibaraki 305-8565, Japan., Thissen A; SPECS Surface Nano Analysis GmbH, Voltastraße 5, 13355 Berlin, Germany., Thomas AG; School of Materials, Photon Science Institute and Sir Henry Royce Institute, Alan Turing Building, University of Manchester, Oxford Road, Manchester M13 9PL, United Kingdom., Britton AJ; Versatile X-ray Spectroscopy Facility, School of Chemical and Process Engineering, University of Leeds, Leeds LS2 9JT, United Kingdom., Bernasik A; Academic Centre for Materials and Nanotechnology, AGH University of Science and Technology, 30-059 Kraków, Poland., Fuchs A; Robert Bosch GmbH, Robert-Bosch-Campus, 71272 Renningen, Germany., Baddorf AP; Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, 1 Bethel Valley Road, Oak Ridge, Tennessee 37830., Bock B; Tascon GmbH, Mendelstr. 17, D-48149 Münster, Germany., Theilacker B; Medtronic, 710 Medtronic Parkway, LT240, Fridley, Minnesota 55432., Cheng B; Analysis and Testing Center, Beijing University of Chemical Technology, Beijing 100029, People's Republic of China., Castner DG; National ESCA and Surface Analysis Center for Biomedical Problems, Department of Bioengineering and Chemical Engineering, University of Washington, Seattle, Washington 98195., Morgan DJ; Cardiff Catalysis Institute, School of Chemistry, Cardiff University, Main Building, Cardiff CF10 3AT, United Kingdom., Valley D; Physical Electronics Inc., East Chanhassen, Minnesota 55317., Willneff EA; Versatile X-ray Spectroscopy Facility, School of Design, University of Leeds, Leeds LS2 9JT, United Kingdom., Smith EF; Nanoscale and Microscale Research Centre, University of Nottingham, Nottingham NG7 2RD, United Kingdom., Nolot E; CEA-LETI, 17 rue des Martyrs, 38054 Grenoble, France., Xie F; Instrumental Analysis & Research Center, Sun Yat-sen University, Guangzhou 510275, People's Republic of China., Zorn G; GE Research, 1 Research Circle, K1 1D7A, Niskayuna, New York 12309., Smith GC; Faculty of Science and Engineering, University of Chester, Thornton Science Park, Chester CH2 4NU, United Kingdom., Yasufuku H; Materials Analysis Station, National Institute for Materials Science (NIMS), 1-2-1 Sengen, Tsukuba, Ibaraki 305-0044, Japan., Fenton JL; Medtronic, 6700 Shingle Creek Parkway, Brooklyn Center, Minnesota 55430., Chen J; Instrumental Analysis & Research Center, Sun Yat-sen University, Guangzhou 510275, People's Republic of China., Counsell JDP; Kratos Analytical Ltd., Wharfside, Trafford Wharf Road, Manchester M17 1GP, United Kingdom., Radnik J; Bundesanstalt für Materialforschung und -prüfung (BAM), Unter den Eichen 44-46, 12203 Berlin, Germany., Gaskell KJ; Department of Chemistry and Biochemistry, University of Maryland, College Park, Maryland 20742., Artyushkova K; Physical Electronics Inc., East Chanhassen, Minnesota 55317., Yang L; Department of Chemistry, Xi'an Jiaotong-Liverpool University, 111 Ren'ai Road, Suzhou Dushu Lake Science and Education Innovation District, Suzhou Industrial Park, Suzhou 215123, People's Republic of China., Zhang L; National Metrology Institute of Japan (NMIJ), National Institute of Advanced Industrial Science and Technology (AIST), 1-1-1 Higashi, Tsukuba, Ibaraki 305-8565, Japan., Eguchi M; Analysis Department, Materials Characterization Division, Futtsu Unit, Nippon Steel Technology Co. Ltd., 20-1 Shintomi, Futtsu City, Chiba 293-0011, Japan., Walker M; Department of Physics, University of Warwick, Coventry, West Midlands CV4 7AL, United Kingdom., Hajdyła M; Academic Centre for Materials and Nanotechnology, AGH University of Science and Technology, 30-059 Kraków, Poland., Marzec MM; Academic Centre for Materials and Nanotechnology, AGH University of Science and Technology, 30-059 Kraków, Poland., Linford MR; Department of Chemistry and Biochemistry, Brigham Young University, C100 BNSN, Provo, Utah 84602., Kubota N; Analysis Department, Materials Characterization Division, Futtsu Unit, Nippon Steel Technology Co. Ltd., 20-1 Shintomi, Futtsu City, Chiba 293-0011, Japan., Cortazar-Martínez O; CINVESTAV-Unidad Queretaro, Queretaro 76230, Mexico., Dietrich P; SPECS Surface Nano Analysis GmbH, Voltastraße 5, 13355 Berlin, Germany., Satoh R; Analysis Department, Materials Characterization Division, Futtsu Unit, Nippon Steel Technology Co. Ltd., 20-1 Shintomi, Futtsu City, Chiba 293-0011, Japan., Schroeder SLM; Versatile X-ray Spectroscopy Facility, School of Chemical and Process Engineering, University of Leeds, Leeds LS2 9JT, United Kingdom., Avval TG; Department of Chemistry and Biochemistry, Brigham Young University, C100 BNSN, Provo, Utah 84602., Nagatomi T; Platform Laboratory for Science and Technology, Asahi Kasei Corporation, 2-1 Samejima, Fuji, Shizuoka 416-8501, Japan., Fernandez V; Université de Nantes, CNRS, Institut des Matériaux Jean Rouxel, IMN, F-44000 Nantes, France., Lake W; Atomic Weapons Establishment (AWE), Aldermaston, Reading, Berkshire RG7 4PR, United Kingdom., Azuma Y; National Metrology Institute of Japan (NMIJ), National Institute of Advanced Industrial Science and Technology (AIST), 1-1-1 Higashi, Tsukuba, Ibaraki 305-8565, Japan., Yoshikawa Y; Material Analysis Department, Yazaki Research and Technology Center, Yazaki Corporation, 1500 Mishuku, Susono-city, Shizuoka 410-1194, Japan., Shard AG; National Physical Laboratory, Hampton Road, Teddington TW11 0LW, United Kingdom.
Publikováno v:
Journal of vacuum science & technology. A, Vacuum, surfaces, and films : an official journal of the American Vacuum Society [J Vac Sci Technol A] 2020 Dec; Vol. 38 (6), pp. 063208. Date of Electronic Publication: 2020 Nov 23.
Autor:
Luo C; Department of Chemical and Biomolecular Engineering, University of Maryland, College Park, MD 20742.; Department of Chemistry and Biochemistry, George Mason University, Fairfax, VA 22030., Hu E; Chemistry Division, Brookhaven National Laboratory, Upton, NY 11973., Gaskell KJ; Department of Chemistry and Biochemistry, University of Maryland, College Park, MD 20742., Fan X; Department of Chemical and Biomolecular Engineering, University of Maryland, College Park, MD 20742., Gao T; Department of Chemical Engineering, Massachusetts Institute of Technology, Cambridge, MA 02139., Cui C; Department of Chemical and Biomolecular Engineering, University of Maryland, College Park, MD 20742., Ghose S; National Synchrotron Light Source II, Brookhaven National Laboratory, Upton, NY 11973., Yang XQ; Chemistry Division, Brookhaven National Laboratory, Upton, NY 11973., Wang C; Department of Chemical and Biomolecular Engineering, University of Maryland, College Park, MD 20742; cswang@umd.edu.; Department of Chemistry and Biochemistry, University of Maryland, College Park, MD 20742.
Publikováno v:
Proceedings of the National Academy of Sciences of the United States of America [Proc Natl Acad Sci U S A] 2020 Jun 30; Vol. 117 (26), pp. 14712-14720. Date of Electronic Publication: 2020 Jun 17.
Autor:
Linford MR; Department of Chemistry and Biochemistry, Brigham Young University, Provo, UT84602, USA., Smentkowski VS; General Electric Research, Niskayuna, NY12309, USA., Grant JT; Surface Analysis Consultant, Clearwater, FL33767, USA., Brundle CR; C.R. Brundle & Associates, Soquel, CA95073, USA., Sherwood PMA; University of Washington, Box 351700, Seattle, WA98195, USA., Biesinger MC; Surface Science Western, University of Western Ontario, London, OntarioN6G 0J3, Canada., Terry J; Department of Physics, Illinois Institute of Technology, Chicago, IL60616, USA., Artyushkova K; Physical Electronics, Chanhassen, MN55317, USA., Herrera-Gómez A; CINVESTAV - Unidad Queretaro, Real de Juriquilla76230, Mexico., Tougaard S; Department of Physics, University of Southern Denmark, Odense5230, Denmark., Skinner W; Future Industries Institute, University of South Australia, Mawson Lakes, SA 5095, Australia., Pireaux JJ; University of Namur, Namur Institute of Structured Matter, B-5000Namur, Belgium., McConville CF; College of Science, RMIT University, Melbourne, VIC3001, Australia., Easton CD; CSIRO Manufacturing, Ian Wark Laboratories, Clayton, VIC3168, Australia., Gengenbach TR; CSIRO Manufacturing, Ian Wark Laboratories, Clayton, VIC3168, Australia., Major GH; Department of Chemistry and Biochemistry, Brigham Young University, Provo, UT84602, USA., Dietrich P; SPECS Surface Nano Analysis GmbH, 13355Berlin, Germany., Thissen A; SPECS Surface Nano Analysis GmbH, 13355Berlin, Germany., Engelhard M; Pacific Northwest National Laboratory, Richland, WA99354, USA., Powell CJ; National Institute of Standards and Technology, Gaithersburg, MD20899, USA., Gaskell KJ; University of Maryland, College Park, MD20742, USA., Baer DR; Pacific Northwest National Laboratory, Richland, WA99354, USA.
Publikováno v:
Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada [Microsc Microanal] 2020 Feb; Vol. 26 (1), pp. 1-2.
Autor:
Wang L; Department of Chemistry and Biochemistry, University of Maryland, College Park, MD, USA., Menakath A; Department of Physics, University of Warwick, Coventry, UK., Han F; Department of Chemical and Biomolecular Engineering, University of Maryland, College Park, MD, USA., Wang Y; Department of Chemistry and Biochemistry, University of Maryland, College Park, MD, USA., Zavalij PY; Department of Chemistry and Biochemistry, University of Maryland, College Park, MD, USA., Gaskell KJ; Department of Chemistry and Biochemistry, University of Maryland, College Park, MD, USA., Borodin O; Electrochemistry Branch, Power and Energy Division Sensor and Electron Devices Directorate, US Army Research Laboratory, Adelphi, MD, USA., Iuga D; Department of Physics, University of Warwick, Coventry, UK., Brown SP; Department of Physics, University of Warwick, Coventry, UK., Wang C; Department of Chemistry and Biochemistry, University of Maryland, College Park, MD, USA. cswang@umd.edu.; Department of Chemical and Biomolecular Engineering, University of Maryland, College Park, MD, USA. cswang@umd.edu., Xu K; Electrochemistry Branch, Power and Energy Division Sensor and Electron Devices Directorate, US Army Research Laboratory, Adelphi, MD, USA. conrad.k.xu.civ@mail.mil., Eichhorn BW; Department of Chemistry and Biochemistry, University of Maryland, College Park, MD, USA. eichhorn@umd.edu.
Publikováno v:
Nature chemistry [Nat Chem] 2019 Sep; Vol. 11 (9), pp. 789-796. Date of Electronic Publication: 2019 Aug 19.
Autor:
Baer DR; Pacific Northwest National Laboratory, Environmental Molecular Sciences Laboratory, P. O. Box 999, Richland, Washington 99352., Artyushkova K; Physical Electronics Inc., Chanhassen, Minnesota 55317., Brundle CR; C R Brundle & Associates, 4215 Fairway Drive, Soquel, California 95073., Castle JE; University of Surrey, Department of Mechanical Engineering Science, Guildford, Surrey, GU2 7XH, United Kingdom., Engelhard MH; Pacific Northwest National Laboratory, Environmental Molecular Sciences Laboratory, P. O. Box 999, Richland Washington 99352., Gaskell KJ; University of Maryland, Department of Chemistry and Biochemistry, College Park, Maryland 20720., Grant JT; Surface Analysis Consulting, Clearwater, Florida 33767., Haasch RT; University of Illinois, Materials Research Laboratory, 104 S. Goodwin Ave, Urbana, Illinois 61801-2902., Linford MR; Brigham Young University, Department of Chemistry & Biochemistry, Provo, Utah 84602., Powell CJ; National Institute of Standards and Technology, 100 Bureau Drive, Gaithersburg, Maryland 20899-8370., Shard AG; National Physical Laboratory, Teddington TW11 0LW, United Kingdom., Sherwood PMA; University of Washington, Department of Chemistry, Seattle, Washington 98950., Smentkowski VS; General Electric GRC, 1 Research Circle, Bldg K1 1D41, Niskayuna, New York 12309.
Publikováno v:
Journal of vacuum science & technology. A, Vacuum, surfaces, and films : an official journal of the American Vacuum Society [J Vac Sci Technol A] 2019; Vol. 37.