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Autor:
Leibowitz, B.S., Kizer, J., Haechang Lee, Chen, F., Ho, A., Jeeradit, M., Bansal, A., Greer, T., Li, S., Farjad-Rad, R., Stonecypher, W., Frans, Y., Daly, B., Heaton, F., Gariepp, B.W., Werner, C.W., Nhat Nguyen, Stojanovic, V., Zerbe, J.L.
Publikováno v:
2007 IEEE International Solid-State Circuits Conference. Digest of Technical Papers; 2007, p228-599, 372p