Zobrazeno 1 - 2
of 2
pro vyhledávání: '"Garcia, V Villaverde"'
Autor:
Fabiani, S, Ahangarianabhari, M, Baldazzi, G, Bellutti, P, Bertuccio, G, Bruschi, M, Bufon, J, Carrato, S, Castoldi, A, Cautero, G, Ciano, S, Cicuttin, A, Crespo, M L, Santos, M Dos, Gandola, M, Giacomini, G, Giuressi, D, Guazzoni, C, Menk, R H, Niemela, J, Olivi, L, Picciotto, A, Piemonte, C, Rashevskaya, I, Rachevski, A, Rignanese, L P, Sbrizzi, A, Schillani, S, Vacchi, A, Garcia, V Villaverde, Zampa, G, Zampa, N, Zorzi, N
The XAFS beamline at Elettra Synchrotron in Trieste combines X-ray absorption spectroscopy and X-ray diffraction to provide chemically specific structural information of materials. It operates in the energy range 2.4-27 keV by using a silicon double
Externí odkaz:
http://arxiv.org/abs/1601.02784
Autor:
Joseph Niemela, N. Zampa, Claudio Piemonte, Dario Giuressi, Marco Bruschi, Nicola Zorzi, Luca Olivi, Gianluigi Zampa, L. P. Rignanese, Giuseppe Baldazzi, A. Sbrizzi, J. Bufon, Ralf Hendrik Menk, A. Rachevski, M. Ahangarianabhari, Pierluigi Bellutti, S. Schillani, Sergio Fabiani, Chiara Guazzoni, S. Ciano, Andrea Vacchi, V Garcia, G. Giacomini, Antonino Picciotto, M. Dos Santos, Maria Liz Crespo, Irina Rashevskaya, Andrea Castoldi, M. Gandola, Sergio Carrato, Andres Cicuttin, Giuseppe Bertuccio, Giuseppe Cautero
The XAFS beamline at Elettra Synchrotron in Trieste combines X-ray absorption spectroscopy and X-ray diffraction to provide chemically specific structural information of materials. It operates in the energy range 2.4-27 keV by using a silicon double
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::8cc9aa2352c4d5fe8926f31f2d041e7b