Zobrazeno 1 - 4
of 4
pro vyhledávání: '"Gallegos AO"'
Autor:
Zhou Q; Department of Electrical Engineering, Stanford University, Stanford, 94305, CA, USA., Wirtz BM; Department of Chemical Engineering, Stanford University, Stanford, 94305, CA, USA., Schloemer TH; Department of Electrical Engineering, Stanford University, Stanford, 94305, CA, USA., Burroughs MC; Department of Chemical Engineering, Stanford University, Stanford, 94305, CA, USA., Hu M; Department of Electrical Engineering, Stanford University, Stanford, 94305, CA, USA., Narayanan P; Department of Electrical Engineering, Stanford University, Stanford, 94305, CA, USA.; Department of Chemistry, Stanford University, Stanford, 94305, CA, USA., Lyu J; Department of Electrical Engineering, Stanford University, Stanford, 94305, CA, USA., Gallegos AO; Department of Electrical Engineering, Stanford University, Stanford, 94305, CA, USA., Layton C; Department of Electrical Engineering, Stanford University, Stanford, 94305, CA, USA., Mai DJ; Department of Chemical Engineering, Stanford University, Stanford, 94305, CA, USA., Congreve DN; Department of Electrical Engineering, Stanford University, Stanford, 94305, CA, USA.
Publikováno v:
Advanced materials (Deerfield Beach, Fla.) [Adv Mater] 2023 Nov; Vol. 35 (46), pp. e2301563. Date of Electronic Publication: 2023 Oct 15.
Autor:
Schloemer TH; Rowland Institute, Harvard University; Department of Electrical Engineering, Stanford University., Sanders SN; Rowland Institute, Harvard University., Zhou Q; Department of Electrical Engineering, Stanford University., Narayanan P; Department of Chemistry, Stanford University., Hu M; Department of Electrical Engineering, Stanford University., Gangishetty MK; Rowland Institute, Harvard University., Anderson D; Rowland Institute, Harvard University., Seitz M; Rowland Institute, Harvard University; Department of Electrical Engineering, Stanford University., Gallegos AO; Department of Electrical Engineering, Stanford University., Stokes RC; Rowland Institute, Harvard University., Congreve DN; Rowland Institute, Harvard University; Department of Electrical Engineering, Stanford University; congreve@stanford.edu.
Publikováno v:
Journal of visualized experiments : JoVE [J Vis Exp] 2022 Sep 07 (187). Date of Electronic Publication: 2022 Sep 07.
Autor:
Sanders SN; Rowland Institute at Harvard University, Cambridge, MA, USA., Schloemer TH; Rowland Institute at Harvard University, Cambridge, MA, USA.; Department of Electrical Engineering, Stanford University, Stanford, CA, USA., Gangishetty MK; Rowland Institute at Harvard University, Cambridge, MA, USA., Anderson D; Rowland Institute at Harvard University, Cambridge, MA, USA., Seitz M; Rowland Institute at Harvard University, Cambridge, MA, USA.; Department of Electrical Engineering, Stanford University, Stanford, CA, USA., Gallegos AO; Department of Electrical Engineering, Stanford University, Stanford, CA, USA., Stokes RC; Rowland Institute at Harvard University, Cambridge, MA, USA., Congreve DN; Rowland Institute at Harvard University, Cambridge, MA, USA. congreve@stanford.edu.; Department of Electrical Engineering, Stanford University, Stanford, CA, USA. congreve@stanford.edu.
Publikováno v:
Nature [Nature] 2022 Apr; Vol. 604 (7906), pp. 474-478. Date of Electronic Publication: 2022 Apr 20.
Autor:
Gallegos AO; Electrical Engineering, Stanford University, Stanford, CA 94305, USA., Ahmed GH; Electrical Engineering, Stanford University, Stanford, CA 94305, USA., Schloemer TH; Electrical Engineering, Stanford University, Stanford, CA 94305, USA., Congreve DN; Electrical Engineering, Stanford University, Stanford, CA 94305, USA.
Publikováno v:
Matter [Matter] 2021 Oct 06; Vol. 4 (10), pp. 3074-3077.