Zobrazeno 1 - 10
of 202
pro vyhledávání: '"Gahoi, A."'
Autor:
Gahoi, Amit, Wagner, Stefan, Bablich, Andreas, Kataria, Satender, Passi, Vikram, Lemme, Max C.
Publikováno v:
Solid-State Electronics, Volume 125, November, Pages 234-239, 2016
In this study, the contact resistance of various metals to chemical vapour deposited (CVD) monolayer graphene is investigated. Transfer length method (TLM) structures with varying widths and separation between contacts have been fabricated and electr
Externí odkaz:
http://arxiv.org/abs/2211.12415
Autor:
Gahoi, Akshat, Duneja, Jayant, Padhi, Anshul, Mangale, Shivam, Rajput, Saransh, Kamble, Tanvi, Sharma, Dipti Misra, Varma, Vasudeva
Code-mixed machine translation has become an important task in multilingual communities and extending the task of machine translation to code mixed data has become a common task for these languages. In the shared tasks of WMT 2022, we try to tackle t
Externí odkaz:
http://arxiv.org/abs/2210.12215
Autor:
Kataria, Satender, Wagner, Stefan, Ruhkopf, Jasper, Gahoi, Aamit, Pandey, Himadri, Bornemann, Rainer, Vaziri, Sam, Smith, Anderson D., Östling, Mikael, Lemme, Max C.
Publikováno v:
physica status solidi (a), 211 (11), 2439-2449, 2014
Graphene is a material with enormous potential for numerous applications. Therefore, significant efforts are dedicated to large-scale graphene production using a chemical vapor deposition (CVD) technique. In addition, research is directed at developi
Externí odkaz:
http://arxiv.org/abs/2103.14880
Autor:
Gahoi, Amit, Kataria, Satender, Driussi, Francesco, Venica, Stefano, Pandey, Himadri, Esseni, David, Selmi, Luca, Lemme, Max C.
Publikováno v:
Advanced Electronic Materials 6 (10), 2000386, 2020
The accurate extraction and the reliable, repeatable reduction of graphene - metal contact resistance (R$_{C}$) are still open issues in graphene technology. Here, we demonstrate the importance of following clear protocols when extracting R$_{C}$ usi
Externí odkaz:
http://arxiv.org/abs/2008.03218
Autor:
Passi, Vikram, Gahoi, Amit, Marin, Enrique G., Cusati, Teresa, Fortunelli, Alessandro, Iannaccone, Giuseppe, Fiori, Gianluca, Lemme, Max C.
Publikováno v:
Advanced Materials Interfaces, 6(1): 1801285, 2019
A systematic investigation of graphene edge contacts is provided. Intentionally patterning monolayer graphene at the contact region creates well-defined edge contacts that lead to a 67% enhancement in current injection from a gold contact. Specific c
Externí odkaz:
http://arxiv.org/abs/1807.04772
Autor:
Passi, Vikram, Gahoi, Amit, Senkovskiy, Boris V., Haberer, Danny, Fischer, Felix R., Grüneis, Alexander, Lemme, Max C.
Publikováno v:
ACS Applied Materials & Interfaces, 2018
We report on the experimental demonstration and electrical characterization of N = 7 armchair graphene nanoribbon (7-AGNR) field effect transistors. The back-gated transistors are fabricated from atomically precise and highly aligned 7-AGNRs, synthes
Externí odkaz:
http://arxiv.org/abs/1803.07155
Autor:
Lupina, Grzegorz, Kitzmann, Julia, Costina, Ioan, Lukosius, Mindaugas, Wenger, Christian, Wolff, Andre, Vaziri, Sam, Ostling, Mikael, Pasternak, Iwona, Krajewska, Aleksandra, Strupinski, Wlodek, Kataria, Satender, Gahoi, Amit, Lemme, Max C., Ruhl, Guenther, Zoth, Guenther, Luxenhofer, Oliver, Mehr, Wolfgang
Publikováno v:
ACS Nano, 9 (2015) 4776
Integration of graphene with Si microelectronics is very appealing by offering potentially a broad range of new functionalities. New materials to be integrated with Si platform must conform to stringent purity standards. Here, we investigate graphene
Externí odkaz:
http://arxiv.org/abs/1505.00889
Autor:
Driussi, F., Venica, S., Gahoi, A., Gambi, A., Giannozzi, P., Kataria, S., Lemme, M.C., Palestri, P., Esseni, D.
Publikováno v:
In Microelectronic Engineering 15 August 2019 216
Autor:
Matthias Konig, Gunther Ruhl, Amit Gahoi, Sebastian Wittmann, Tobias Preis, Joerg-Martin Batke, Ioan Costina, Max C. Lemme
Publikováno v:
IEEE Journal of the Electron Devices Society, Vol 7, Pp 219-226 (2019)
A reliable method is proposed for measuring specific contact resistivity (pC) for graphenemetal contacts, which is based on a contact end resistance measurement. We investigate the proposed method with simulations and confirm that the sheet resistanc
Externí odkaz:
https://doaj.org/article/112ca46c6a4641b4866fa30c9293a11a
Publikováno v:
BMC Genetics, Vol 20, Iss 1, Pp 1-13 (2019)
Abstract Background Identification of unknown fungal species aids to the conservation of fungal diversity. As many fungal species cannot be cultured, morphological identification of those species is almost impossible. But, DNA barcoding technique can
Externí odkaz:
https://doaj.org/article/fd096e6f94334624b1af2a254a075bf1