Zobrazeno 1 - 10
of 145
pro vyhledávání: '"Gacka E"'
New design of operational MEMS bridges for measurements of properties of FEBID-based nanostructures.
Autor:
Pruchnik B; Department of Nanometrology, Wrocław University of Science and Technology, Janiszewskiego 11/17, 50-370, Wrocław, Poland., Kwoka K; Department of Nanometrology, Wrocław University of Science and Technology, Janiszewskiego 11/17, 50-370, Wrocław, Poland., Gacka E; Department of Nanometrology, Wrocław University of Science and Technology, Janiszewskiego 11/17, 50-370, Wrocław, Poland., Badura D; Department of Nanometrology, Wrocław University of Science and Technology, Janiszewskiego 11/17, 50-370, Wrocław, Poland., Kunicki P; Department of Nanometrology, Wrocław University of Science and Technology, Janiszewskiego 11/17, 50-370, Wrocław, Poland., Sierakowski A; Institute of Microelectronics and Photonics, Łukasiewicz Research Network, Lotników 32/46, 02-668, Warsaw, Poland., Janus P; Institute of Microelectronics and Photonics, Łukasiewicz Research Network, Lotników 32/46, 02-668, Warsaw, Poland., Piasecki T; Department of Nanometrology, Wrocław University of Science and Technology, Janiszewskiego 11/17, 50-370, Wrocław, Poland., Gotszalk T; Department of Nanometrology, Wrocław University of Science and Technology, Janiszewskiego 11/17, 50-370, Wrocław, Poland.
Publikováno v:
Beilstein journal of nanotechnology [Beilstein J Nanotechnol] 2024 Oct 23; Vol. 15, pp. 1273-1282. Date of Electronic Publication: 2024 Oct 23 (Print Publication: 2024).
Autor:
Pruchnik BC; Department of Nanometrology, Wrocław University of Science and Technology, Janiszewskiego 11/17, Wrocław 50-370, Poland., Fidelus JD; Time and Length Department, Central Office of Measures, Elektoralna 2, Warsaw 00-139, Poland. Electronic address: janusz.fidelus@gum.gov.pl., Gacka E; Department of Nanometrology, Wrocław University of Science and Technology, Janiszewskiego 11/17, Wrocław 50-370, Poland., Mika K; Department of Physical Chemistry and Electrochemistry Department, Faculty of Chemistry, Jagiellonian University, Gronostajowa 2, Kraków 30-387, Poland., Zaraska L; Department of Physical Chemistry and Electrochemistry Department, Faculty of Chemistry, Jagiellonian University, Gronostajowa 2, Kraków 30-387, Poland., Sulka GD; Department of Physical Chemistry and Electrochemistry Department, Faculty of Chemistry, Jagiellonian University, Gronostajowa 2, Kraków 30-387, Poland., Gotszalk TP; Department of Nanometrology, Wrocław University of Science and Technology, Janiszewskiego 11/17, Wrocław 50-370, Poland.
Publikováno v:
Ultramicroscopy [Ultramicroscopy] 2024 Sep; Vol. 263, pp. 113985. Date of Electronic Publication: 2024 May 07.
Autor:
Piasecki T; Department of Nanometrology, Wroclaw University of Science and Technology, Wroclaw, Poland., Kwoka K; Department of Nanometrology, Wroclaw University of Science and Technology, Wroclaw, Poland., Gacka E; Department of Nanometrology, Wroclaw University of Science and Technology, Wroclaw, Poland., Kunicki P; Department of Nanometrology, Wroclaw University of Science and Technology, Wroclaw, Poland., Gotszalk T; Department of Nanometrology, Wroclaw University of Science and Technology, Wroclaw, Poland.
Publikováno v:
Nanotechnology [Nanotechnology] 2023 Dec 27; Vol. 35 (11). Date of Electronic Publication: 2023 Dec 27.
Autor:
Pruchnik BC; Department of Nanometrology, Wrocław University of Science and Technology, Janiszewskiego 11/17, 50-370 Wroclaw, Poland., Fidelus JD; Time and Length Department, Central Office of Measures, Elektoralna 2, 00-139 Warsaw, Poland., Gacka E; Department of Nanometrology, Wrocław University of Science and Technology, Janiszewskiego 11/17, 50-370 Wroclaw, Poland., Kwoka K; Department of Nanometrology, Wrocław University of Science and Technology, Janiszewskiego 11/17, 50-370 Wroclaw, Poland., Pruchnik J; Department of Nanometrology, Wrocław University of Science and Technology, Janiszewskiego 11/17, 50-370 Wroclaw, Poland., Piejko A; Department of Nanometrology, Wrocław University of Science and Technology, Janiszewskiego 11/17, 50-370 Wroclaw, Poland., Usydus Ł; Electricity and Radiation Department, Central Office of Measures, Elektoralna 2, 00-139 Warsaw, Poland., Zaraska L; Department of Physical Chemistry and Electrochemistry, Faculty of Chemistry, Jagiellonian University, Gronostajowa 2, 30-387 Krakow, Poland., Sulka GD; Department of Physical Chemistry and Electrochemistry, Faculty of Chemistry, Jagiellonian University, Gronostajowa 2, 30-387 Krakow, Poland., Piasecki T; Department of Nanometrology, Wrocław University of Science and Technology, Janiszewskiego 11/17, 50-370 Wroclaw, Poland., Gotszalk TP; Department of Nanometrology, Wrocław University of Science and Technology, Janiszewskiego 11/17, 50-370 Wroclaw, Poland.
Publikováno v:
Nanomaterials (Basel, Switzerland) [Nanomaterials (Basel)] 2023 Aug 30; Vol. 13 (17). Date of Electronic Publication: 2023 Aug 30.
Akademický článek
Tento výsledek nelze pro nepřihlášené uživatele zobrazit.
K zobrazení výsledku je třeba se přihlásit.
K zobrazení výsledku je třeba se přihlásit.
Akademický článek
Tento výsledek nelze pro nepřihlášené uživatele zobrazit.
K zobrazení výsledku je třeba se přihlásit.
K zobrazení výsledku je třeba se přihlásit.
Autor:
Gacka E; Department of Nanometrology, Faculty of Electronics, Photonics and Microsystems, Wrocław University of Science and Technology, Janiszewskiego 11/17, 50-372 Wrocław, Poland. Electronic address: ewelina.gacka@pwr.edu.pl., Kunicki P; Department of Nanometrology, Faculty of Electronics, Photonics and Microsystems, Wrocław University of Science and Technology, Janiszewskiego 11/17, 50-372 Wrocław, Poland., Łysik P; Department of Nanometrology, Faculty of Electronics, Photonics and Microsystems, Wrocław University of Science and Technology, Janiszewskiego 11/17, 50-372 Wrocław, Poland., Gajewski K; Department of Nanometrology, Faculty of Electronics, Photonics and Microsystems, Wrocław University of Science and Technology, Janiszewskiego 11/17, 50-372 Wrocław, Poland., Ciechanowicz P; Łukasiewicz Research Network - PORT Polish Centre for Technology Development, Stabłowicka 147, 54-066 Wrocław, Poland; Faculty of Physics and Astronomy, University of Wrocław, Maxa Borna 9, 50-204 Wrocław, Poland., Pucicki D; Department of Nanometrology, Faculty of Electronics, Photonics and Microsystems, Wrocław University of Science and Technology, Janiszewskiego 11/17, 50-372 Wrocław, Poland; Łukasiewicz Research Network - PORT Polish Centre for Technology Development, Stabłowicka 147, 54-066 Wrocław, Poland., Majchrzak D; Łukasiewicz Research Network - PORT Polish Centre for Technology Development, Stabłowicka 147, 54-066 Wrocław, Poland; Faculty of Physics and Astronomy, University of Wrocław, Maxa Borna 9, 50-204 Wrocław, Poland; Institute of Low Temperature and Structure Research Polish Academy of Science, Okólna 2, 50-422 Wrocław, Poland., Gotszalk T; Department of Nanometrology, Faculty of Electronics, Photonics and Microsystems, Wrocław University of Science and Technology, Janiszewskiego 11/17, 50-372 Wrocław, Poland., Piasecki T; Department of Nanometrology, Faculty of Electronics, Photonics and Microsystems, Wrocław University of Science and Technology, Janiszewskiego 11/17, 50-372 Wrocław, Poland., Busani T; Center for High Technology Materials (CHTM), University of New Mexico (UNM), Albuquerque, New Mexico 87106, United States., Rangelow IW; Group of Nanoscale Systems, Technische Universität Ilmenau, Gustav-Kirchhoff-Straße1, 98693 Ilmenau, Germany., Hommel D; Łukasiewicz Research Network - PORT Polish Centre for Technology Development, Stabłowicka 147, 54-066 Wrocław, Poland; Institute of Low Temperature and Structure Research Polish Academy of Science, Okólna 2, 50-422 Wrocław, Poland.
Publikováno v:
Ultramicroscopy [Ultramicroscopy] 2023 Jun; Vol. 248, pp. 113713. Date of Electronic Publication: 2023 Mar 06.
Autor:
Dąbrowa T; Department of Prosthodontics, Wrocław Medical University, ul. Krakowska 26, 50-425 Wrocław, Poland., Badura D; Nanometrology Department, Wroclaw University of Science and Technology, Janiszewskiego 11/17, 50-372 Wroclaw, Poland., Pruchnik B; Nanometrology Department, Wroclaw University of Science and Technology, Janiszewskiego 11/17, 50-372 Wroclaw, Poland., Gacka E; Nanometrology Department, Wroclaw University of Science and Technology, Janiszewskiego 11/17, 50-372 Wroclaw, Poland., Kopczyński W; Nanometrology Department, Wroclaw University of Science and Technology, Janiszewskiego 11/17, 50-372 Wroclaw, Poland., Mikulewicz M; Department of Dentofacial Orthopaedics and Orthodontics, Division of Facial Abnormalities, Wrocław Medical University, ul. Krakowska 26, 50-425 Wrocław, Poland., Gotszalk T; Nanometrology Department, Wroclaw University of Science and Technology, Janiszewskiego 11/17, 50-372 Wroclaw, Poland., Kijak E; Department of Prosthodontics, Wrocław Medical University, ul. Krakowska 26, 50-425 Wrocław, Poland.
Publikováno v:
Materials (Basel, Switzerland) [Materials (Basel)] 2023 Feb 28; Vol. 16 (5). Date of Electronic Publication: 2023 Feb 28.
Akademický článek
Tento výsledek nelze pro nepřihlášené uživatele zobrazit.
K zobrazení výsledku je třeba se přihlásit.
K zobrazení výsledku je třeba se přihlásit.
Autor:
Pruchnik B; Department of Nanometrology, Faculty of Electronics, Photonics and Microsystems, Wrocław University of Science and Technology, Janiszewskiego 11/17, 50-372, Wrocław, Poland. bartosz.pruchnik@pwr.edu.pl., Orłowska K; Department of Nanometrology, Faculty of Electronics, Photonics and Microsystems, Wrocław University of Science and Technology, Janiszewskiego 11/17, 50-372, Wrocław, Poland., Świadkowski B; Department of Nanometrology, Faculty of Electronics, Photonics and Microsystems, Wrocław University of Science and Technology, Janiszewskiego 11/17, 50-372, Wrocław, Poland., Gacka E; Department of Nanometrology, Faculty of Electronics, Photonics and Microsystems, Wrocław University of Science and Technology, Janiszewskiego 11/17, 50-372, Wrocław, Poland., Sierakowski A; Institute of Microelectronics and Fotonics, Łukasiewicz Research Network, Lotników 32/46, 02-668, Warsaw, Poland., Janus P; Institute of Microelectronics and Fotonics, Łukasiewicz Research Network, Lotników 32/46, 02-668, Warsaw, Poland., Gotszalk T; Department of Nanometrology, Faculty of Electronics, Photonics and Microsystems, Wrocław University of Science and Technology, Janiszewskiego 11/17, 50-372, Wrocław, Poland.
Publikováno v:
Scientific reports [Sci Rep] 2023 Jan 10; Vol. 13 (1), pp. 466. Date of Electronic Publication: 2023 Jan 10.