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pro vyhledávání: '"Gabriel Henrique Monteiro Tavares"'
Autor:
Guilherme Marcio Soares, Gabriel Henrique Monteiro Tavares, Henrique A. C. Braga, Pedro S. Almeida, Wesley Josias de Paula
Publikováno v:
IET Power Electronics. 13:2960-2970
The aim of this study is to review the state-of-the-art of recent prediction methods for power metal-oxide-semiconductor field-effect transistors (MOSFETs) switching losses using datasheet parameters. A detailed technical literature investigation is
Autor:
Wesley Josias de Paula, Guilherme Marcio Soares, Henrique A. C. Braga, Pedro S. Almeida, Gabriel Henrique Monteiro Tavares
Publikováno v:
Eletrônica de Potência. 25:283-292
Autor:
Gabriel Henrique Monteiro Tavares, Wesley Josias de Paula, Guilherme Marcio Soares, Denis de Castro Pereira, Henrique A. C. Braga, Pedro S. Almeida
Publikováno v:
2018 13th IEEE International Conference on Industry Applications (INDUSCON).
This paper presents a study of estimation techniques applied to power MOSFET switching losses. Three loss prediction methods are, then, chosen for this proposal. In this context, the first one uses simple equations to describe the switching transient
Autor:
Gabriel Henrique Monteiro Tavares, Henrique A. C. Braga, Marlon L. G. Salmento, Denis de Castro Pereira, Wesley Josias de Paula
Publikováno v:
2017 Brazilian Power Electronics Conference (COBEP).
This paper describes a FPGA-based (Field Programmable Gate Array) high-frequency signal generation platform, which aims to drive GaN (Gallium nitride) power semiconductor devices. FPGA is a digital platform that operates at frequency levels up to GHz
Autor:
Wesley Josias de Paula, Pedro L. Tavares, Denis de Castro Pereira, Gabriel Henrique Monteiro Tavares, Henrique A. C. Braga, Pedro S. Almeida, Filipe L. Silva
Publikováno v:
2017 Brazilian Power Electronics Conference (COBEP).
Gallium Nitride (GaN) are, currently, the most promising semiconductor material concerning new power devices applied in switched-mode power supplies. The great advantages of GaN transistors are their outstanding properties as raw material availabilit