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pro vyhledávání: '"Gabor A. Langer"'
Autor:
Alona Tynkova, Gabor L. Katona, Gabor A. Langer, Sergey I. Sidorenko, Svetlana M. Voloshko, Dezso L. Beke
Publikováno v:
Beilstein Journal of Nanotechnology, Vol 5, Iss 1, Pp 1491-1500 (2014)
It is shown, by using depth profiling with a secondary neutral mass spectrometer and structure investigations by XRD and TEM, that at low temperatures, at which the bulk diffusion is frozen, a complete homogenization can take place in the Cu/Au thin
Externí odkaz:
https://doaj.org/article/8bed9dda1b14442fad2c467887f434dd
Publikováno v:
Beilstein Journal of Nanotechnology, Vol 7, Iss 1, Pp 474-483 (2016)
Alloying by grain boundary diffusion-induced grain boundary migration is investigated by secondary neutral mass spectrometry depth profiling in Ag/Au and Ag/Pd nanocrystalline thin film systems. It is shown that the compositions in zones left behind
Externí odkaz:
https://doaj.org/article/0b0d5aeae12e4ae285b6c74a4a0d31b3