Zobrazeno 1 - 2
of 2
pro vyhledávání: '"GaN semiconductor reliability"'
Publikováno v:
선진국방연구, Vol 6, Iss 2 (2023)
The aim of this study is to develop a testing system that applies RF (Radio Frequency) stress to predict the lifespan of GaN RF semiconductors, a subject of numerous ongoing domestication studies. Additionally, the study proposes an approach that con
Externí odkaz:
https://doaj.org/article/3f1e7c2ba02947e8a370fc2a36d86136
Publikováno v:
선진국방연구, Vol 6, Iss 2 (2023)
The aim of this study is to develop a testing system that applies RF (Radio Frequency) stress to predict the lifespan of GaN RF semiconductors, a subject of numerous ongoing domestication studies. Additionally, the study proposes an approach that con
Externí odkaz:
https://doaj.org/article/ea4bafcb455e40c08823bb6fa22cbbb8