Zobrazeno 1 - 10
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pro vyhledávání: '"GAY SAMUELSON"'
Autor:
Gay Samuelson
Publikováno v:
EDFA Technical Articles. 5:5-10
The Assembly Analytical Forum (AAF) is an organization under the auspices of the Sematech Quality Council. The AAF charter is to develop Packaging Analytical Roadmaps five to ten years into the future that are consistent with the International Techno
Autor:
Thomas M. Moore, Gay Samuelson, Cheryl D. Hartfield, Rajen Dias, Deepak Goyal, Shalabh Tandon
Publikováno v:
EDFA Technical Articles. 3:15-19
Over the last few years, new challenges increased the pressure on packaging and assembly analytical resources. Reduced product development cycle time, increased market segmentation, new package and die level materials, ever shrinking device geometrie
Publikováno v:
JOM. 51:19-21
This article addresses the subtle changes necessary to achieve a margin against an intrinsic failure mechanism in a highly time-constrained development world. The problem of a coefficient of thermal expansion mismatch between a liquid crystal polymer
Publikováno v:
The 1998 international conference on characterization and metrology for ULSI technology.
Next generation assembly/package development challenges are primarily thermal mechanical as interconnect levels increase and product performance drives the need for increased speed and power dissipation. The results of this trend present some distinc
Publikováno v:
Cancer Research. 70:433-433
There has been little improvement in glioblastoma multiforme (GBM) patient prognosis over the past 20 years despite advances in imaging, neurosurgery, post-operative care, radiation delivery and chemotherapy. One reason for treatment failure is the h
Autor:
GAY SAMUELSON
Publikováno v:
ACS Symposium Series ISBN: 9780841207158
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d3f78c94fc2931da08742824ff51ddcf
https://doi.org/10.1021/bk-1982-0184.ch008
https://doi.org/10.1021/bk-1982-0184.ch008
Autor:
He, Ping1,2, Philbrick, Melissa J.2 jli@bidmc.harvard.edu, An, Xiaojin2, Wu, Jiaping2, Messmer-Blust, Angela F.2, Li, Jian2
Publikováno v:
PLoS ONE. Feb2014, Vol. 9 Issue 2, p1-9. 9p.
Autor:
Oates, A.S.
Publikováno v:
IEEE Transactions on Device & Materials Reliability; Mar2004, Vol. 4 Issue 1, p3-3, 1p
Conference
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Conference
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