Zobrazeno 1 - 10
of 67
pro vyhledávání: '"G.R. Massoumi"'
Autor:
T.R. Ophel, Heiko Timmers, S.R. Walker, Peter Mascher, S.G. Wallace, G.R. Massoumi, W. N. Lennard, John A. Davies, Robert Elliman
Publikováno v:
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 170:461-466
Heavy-ion elastic recoil detection analysis (HIERDA) is the ideal technique for quantitative analysis of silicon oxynitride films on silicon because of its unique ability to measure simultaneously all elements of interest (i.e., H, C, N, O and Si), t
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::29ebf9f77e8d5e62ba6978d6ab8b3ac5
https://doi.org/10.1016/s0168-583x(00)00239-1
https://doi.org/10.1016/s0168-583x(00)00239-1
Autor:
G.R. Massoumi, Masoud Kasrai, G. M. Bancroft, L. Rodriguez Fernandez, M.L. Suominen Fuller, W. N. Lennard
Publikováno v:
Tribology Letters. 8:187-192
X‐ray absorption near edge structure (XANES) spectroscopy at the P K‐edge was used to monitor ZDDP antiwear film thickness with rubbing time. Thermal immersion films of varying thickness were generated from the ZDDP and analysed using XANES spect
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::380071496e2ce3664b105b284aa9d1c9
https://doi.org/10.1023/a:1019195404055
https://doi.org/10.1023/a:1019195404055
Publikováno v:
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 152:370-376
We have measured absolute spectra for MeV energy 4He ions backscattered from amorphous silicon, SiO2 and Si3N4 targets. The simulated backscattering spectra from a-Si are only brought into acceptable agreement with experiment when we adopt 4He stoppi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5597adb6dcb822e8b4af118e0058cbbf
https://doi.org/10.1016/s0168-583x(99)00180-9
https://doi.org/10.1016/s0168-583x(99)00180-9
Publikováno v:
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 149:1-6
We have measured the depth distribution of 31P ions implanted at 50 keV to a fluence of 7 × 1015/cm2 into Ge using two methods: first, the surface-sensitive particle-induced X-ray excitation (PIXE) technique utilizing ion-induced X-ray emission has
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::31296b85065366217551800008448e20
https://doi.org/10.1016/s0168-583x(98)00804-0
https://doi.org/10.1016/s0168-583x(98)00804-0
Publikováno v:
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. :1191-1195
The absolute concentration of P in a cyclic phosphazene used as a lubricant additive for hard disk surfaces has been determined by measuring the 4He+-ion induced K X-ray yield. A new method utilized the detection of X-rays emitted at grazing angles w
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::de4289f220710ced825dd1c410647d04
https://doi.org/10.1016/s0168-583x(97)00913-0
https://doi.org/10.1016/s0168-583x(97)00913-0
Publikováno v:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films. 15:2196-2201
A methodology for quantitative measurement of nitrogen and hydrogen atomic composition of thin carbon nitride film using time-of-flight secondary-ion-mass spectrometry is demonstrated. The nitrogen and hydrogen compositions of the film are determined
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2373dec8c018d45d705a292ea4391136
https://doi.org/10.1116/1.580533
https://doi.org/10.1116/1.580533
Publikováno v:
Surface Science. 384:291-301
Particle-induced X-ray excitation measurements are used to deduce the depth distribution for 35 Cl ions implanted at 90 keV into a silicon substrate using a novel experimental technique. The emitted Cl K X-ray yield was measured for grazing emergent
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9430462753abb399ba1c671c88e06b3e
https://doi.org/10.1016/s0039-6028(97)00236-7
https://doi.org/10.1016/s0039-6028(97)00236-7
Publikováno v:
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 122:93-98
The absolute coverage of chlorine on an InP(001) substrate has been determined by a measurement of the Cl K X-ray yield produced by 1.8 MeV 4 He + ions incident on an evaporated NaCl thin film of thickness 6.3 nm. A novel experimental geometry has be
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::bc84e0bcdc33b536961da1284d842e67
https://doi.org/10.1016/s0168-583x(96)00709-4
https://doi.org/10.1016/s0168-583x(96)00709-4
Publikováno v:
Physical Review Letters. 74:3947-3950
Stopping cross sections for 20 keV positrons ({ital S}{sup +}) and electrons ({ital S}{sup {minus}}) in a thin (61 {mu}g/cm{sup 2}) Al target have been measured using an electrostatic analyzer. The results yield a ratio {ital S}{sup +}/{ital S}{sup {
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::adfead9cdab8d91f271b7c18d7fa258c
https://doi.org/10.1103/physrevlett.74.3947
https://doi.org/10.1103/physrevlett.74.3947
Publikováno v:
Surface Science. 324:159-168
Particle-induced X-ray emission measurements combined with Rutherford backscattering spectrometry (including channeling) have been used to measure directly the total sulphur coverage for the S-passivated GaAs(100) surface. The ion-induced X-ray measu
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::f849e88f7008eb218673792621e50082
https://doi.org/10.1016/0039-6028(94)00725-x
https://doi.org/10.1016/0039-6028(94)00725-x