Measurement of synchrotron pulse durations using surface photovoltage transients

Autor: Thornton E. Glover, Robert W. Schoenlein, Ali Belkacem, Philip Heimann, W.F. Steele, Howard A. Padmore, G.D. Ackermann, B. Feinberg, Cédric Ray, Zahid Hussain

Publikováno v: Glover, T.E.; Ackermann, G.D.; Belkacem, A.; Feinberg, B.; Heimann, P.A.; Hussain, Z.; et al.(2001). Measurement of synchrotron pulse durations using surface photovoltage transients. Lawrence Berkeley National Laboratory. Lawrence Berkeley National Laboratory: Lawrence Berkeley National Laboratory. Retrieved from: http://www.escholarship.org/uc/item/2s28z6jv

We report results on experiments using combined laser and synchrotron radiation. Picosecond laser pulses at 800 nm are used to induce surface photovoltage transients in p-type Si samples. A two-component decay is observed. The fast component of decay

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::53f536f390ccfdf0fb4c718bd3a3d51a
https://doi.org/10.1016/s0168-9002(01)00679-9

Ultrafast core-level dynamics during femtosecond laser ablation

Autor: P.A. Heimann, Cédric Ray, Ali Belkacem, G.D. Ackermann, Howard A. Padmore, Thornton E. Glover, Robert W. Schoenlein, Zahid Hussain, W.F. Steele

Publikováno v: Applications of High Field and Short Wavelength Sources IX.

We report, to our knowledge, the first use of pump-probe photoelectron spectroscopy to study core-level dynamics during a laser-driven phase transition. Synchrotron xrays probe the phase transition dynamics during the initial moments of femtosecond l

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::db6c1f1f45bedc0da83ca411b5ade79d
https://doi.org/10.1364/hfsw.2001.wb2

Chemical analysis of particles and semiconductor microstructures by synchrotron radiation soft X-rays photoemission spectromicroscopy

Autor: A. Johnsono, Peter Coon, C. Ayre, Yuri Uritsky, W.F. Steele, F. Gozzo, H. Fujimoto, Howard A. Padmore, T. Renner, G.D. Ackermann, B. Sheridan, R. Ynzunza, P. D. Kinney, Zahid Hussain, Baylor B. Triplett

Publikováno v: Scopus-Elsevier

Chemical analysis on a microscopic scale was performed on a TiN particle sample on silicon and on two patterned samples using a synchrotron source scanning photoemission microscope. For all the experiments, we exploit the ability, developed in our ex

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::02f99fd601cbe904d50c17199622b0bb
http://www.scopus.com/inward/record.url?eid=2-s2.0-0031627926&partnerID=MN8TOARS

Tento výsledek nelze pro nepřihlášené uživatele zobrazit.
K zobrazení výsledku je třeba se přihlásit.

Tento výsledek nelze pro nepřihlášené uživatele zobrazit.
K zobrazení výsledku je třeba se přihlásit.