Zobrazeno 1 - 2
of 2
pro vyhledávání: '"G. P. Kolomoets"'
Publikováno v:
SPIE Proceedings.
The electrical parameters of polysilicon-contacted emitters are investigated. The emitter-base junction C-2-V plots demonstrated an anomaly because of charge occurrence at the polySi-monoSi interface. A critical analysis of well-known methods for emi
Publikováno v:
SPIE Proceedings.
Results of experimental investigation of the current-induced resistance change in polycrystalline silicon films (PSFs) with doping concentrations of 2 (DOT) 1017 cm-3 -2 (DOT) 1020 cm-3 are presented. For the concentration of 1 (DOT) 1019 cm-3 and 2