Zobrazeno 1 - 10
of 31
pro vyhledávání: '"G. Mikuljan"'
Synchrotron-based X-ray Tomographic Microscopy at the Swiss Light Source for Industrial Applications
Autor:
Bernd R. Pinzer, Marco Stampanoni, A. Isenegger, F. Marone, Kevin Mader, Julie L. Fife, S. Irvine, Rajmund Mokso, G. Mikuljan, Peter Modregger
Publikováno v:
Synchrotron Radiation News. 24:24-29
The potential of X-rays for the non-invasive investigation of the interior of bulky samples has long been recognized and their penetration depth is presently widely exploited [1]. Although initially third generation synchrotron sources were almost ex
Autor:
R. Mokso, F. Marone, D. Haberthür, J. C. Schittny, G. Mikuljan, A. Isenegger, M. Stampanoni, Ian McNulty, Catherine Eyberger, Barry Lai
Publikováno v:
AIP Conf. Proc.
Several non‐destructive imaging techniques offer the possibility to observe rapid phenomena in real time, yet most of these techniques fail when it comes to bulky samples and micrometer precision in three dimensions. Therefore there is clearly a ne
Autor:
Christoph Hintermüller, Christian David, Marco Stampanoni, Federica Marone, G. Mikuljan, Samuel A. McDonald
Publikováno v:
Advanced Engineering Materials. 13:116-121
The application of two approaches for high-throughput, high-resolution X-ray phase contrast tomographic imaging being used at the tomographic microscopy and coherent radiology experiments (TOMCAT) beamline of the SLS is discussed and illustrated. Dif
Publikováno v:
Journal of Synchrotron Radiation, 19 (3)
Journal of Synchrotron Radiation
Journal of Synchrotron Radiation
Understanding the formation of materials at elevated temperatures is critical for determining their final properties. Synchrotron-based X-ray tomographic microscopy is an ideal technique for studying such processes because high spatial and temporal r
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::ea59679480aa4e99454373e1946b5f48
https://hdl.handle.net/20.500.11850/48437
https://hdl.handle.net/20.500.11850/48437
Autor:
F. Marone, R. Mokso, P. Modregger, J. Fife, B. Pinzer, T. Thüring, K. Mader, G. Mikuljan, A. Isenegger, M. Stampanoni, Ian McNulty, Catherine Eyberger, Barry Lai
Publikováno v:
AIP Conference Proceedings.
During its first four years of life, the TOMCAT beamline [1] at the Swiss Light Source has established itself as a state‐of‐the art hard x‐ray tomographic microscopy endstation for experiments on a large variety of samples, ranging from the fie
Autor:
Andreas Isenegger, Christoph Hintermüller, Marco Stampanoni, Kevin Mader, Federica Marone, G. Mikuljan
Publikováno v:
Journal of Synchrotron Radiation
Journal of Synchrotron Radiation, 18 (2)
Journal of Synchrotron Radiation, 18 (2)
At the TOMCAT (TOmographic Microscopy and Coherent rAdiology experimenTs) beamline of the Swiss Light Source with an energy range of 8–45 keV and voxel size from 0.37 µm to 7.4 µm, full tomographic datasets are typically acquired in 5 to 10 min.
Autor:
Christoph Hintermüller, Samuel A. McDonald, Franz Pfeiffer, Federica Marone, G. Mikuljan, Christian David, Marco Stampanoni
Publikováno v:
Journal of synchrotron radiation. 16(Pt 4)
Phase-sensitive X-ray imaging methods can provide substantially increased contrast over conventional absorption-based imaging, and therefore new and otherwise inaccessible information. Differential phase-contrast (DPC) imaging, which uses a grating i
Autor:
Marco Stampanoni, G. Mikuljan, Rafael Abela, Christian David, F. Marone, Joan Vila-Comamala, Konstantins Jefimovs, Pavel Trtik
Publikováno v:
Developments in X-Ray Tomography VI.
Over the last decade, synchrotron-based X-ray tomographic microscopy has established itself as a fundamental tool for non-invasive, quantitative investigations of a broad variety of samples, with application ranging from space research and materials
Autor:
Federica Marone, Marco Stampanoni, Rafael Abela, Christoph Hintermüller, Samuel A. McDonald, G. Mikuljan, A. Isenegger
Publikováno v:
Developments in X-Ray Tomography VI.
Synchrotron-based X-ray Tomographic Microscopy is a powerful technique for fast, non-destructive, high resolution quantitative volumetric investigations on diverse samples. At the TOMCAT (TOmographic Microscopy and Coherent radiology experimenTs) bea
Autor:
D. Meister, R. Betemps, Rafael Abela, Marco Stampanoni, Q. Chen, A. Isenegger, Simon Henein, M. Lange, G. Mikuljan, Amela Groso
Publikováno v:
AIP Conference Proceedings.
Synchrotron‐based X‐ray Tomographic Microscopy (SRXTM) is nowadays a powerful technique for non‐destructive, high‐resolution investigations of a broad kind of materials. High‐brilliance and high‐coherence third generation synchrotron radi