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pro vyhledávání: '"G. M. von Staszewski"'
Autor:
G. M. von Staszewski, R. Wollrab
Publikováno v:
Future Infrared Detector Materials.
A strong reduction of the n+-accumulation layer in n-Hgl-xCdxTe (MCT) samples after UV-irradiation was recently reported l 2 3 4. This effect produced by electron trapping in deep levels of the passivation oxide, lasts several hours at 77 K and even
Autor:
Augur, R.A.
Publikováno v:
Proceedings of 1994 IEEE International Reliability Physics Symposium; 1994, p266-273, 8p