Zobrazeno 1 - 10
of 11
pro vyhledávání: '"G. L. Destefanis"'
Autor:
G L Destefanis
Publikováno v:
Semiconductor Science and Technology. 6:C88-C92
This paper gives a description of the infrared photovoltaic detector technology developed by LETI and now industrialized by SOFRADIR. Results obtained on several kinds of arrays both in the 3-5 mu m and 8-12 mu m wavelength ranges are presented. The
Publikováno v:
Physica Status Solidi (a). 47:K63-K66
Autor:
G. L. Destefanis
Publikováno v:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films. 3:171-175
Indium ion implantation in p‐type Hg0.78Cd0.22Te/CdTe epilayers has been investigated by secondary ion mass spectroscopy (SIMS) and 77 K Hall effect measurements. In this paper we show that indium diffusion strongly depends on the way annealing is
Publikováno v:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films. 7:314-320
Suitable improvements of our liquid phase epitaxy (LPE) growth process enable us to obtain excellent quality p‐type as‐grown mercury cadmium telluride (MCT) epilayers, well adapted to high‐performance photovoltaic (PV) detector technology. Alth
Autor:
A. Perez, G. L. Destefanis, P.D. Townsend, J. P. Gailliard, B. W. Farmery, E. L. Ligeon, S. Valette
Publikováno v:
Journal of Applied Physics. 50:7898-7905
Ion implantation is an attractive method for writing optical circuits for use in integrated optics. In LiNbO3 it is shown that there are large changes produced in both refractive indices n0 and ne by the energy deposited in nuclear collisions between
Autor:
G. L. Destefanis, J. P. Gailliard
Publikováno v:
Applied Physics Letters. 36:40-42
Ion implantation in InSb forms a surface layer which looks like a sponge. We show that this structure is related to an elevation of the surface by as much as 2 μm.In this perturbated layer, large voids typically 50 A in diameter were observed by TEM
Publikováno v:
Applied Physics Letters. 44:679-681
Epitaxial n‐type CdxHg1−xTe layers on (111) CdTe substrates have been grown between 250 and 300 °C by sputtering deposition. The standard growth rate was nominally 2 μm/h for a thickness range from 10 to 30 μm. Typical electron concentration i
Publikováno v:
SPIE Proceedings.
The liquid phase epitaxial technique is used to grow Hgl_x Cdx Te (x = .23) from a Te - rich solution onto a Cdl_y ZnyTe (y = .04) buffer layer grown from a Te-rich solution onto a Cdi_yZnyTe bulk substrate in an open tube multibin horizontal slider
Publikováno v:
SPIE Proceedings.
Some physical and electrical properties of liquid phase epitaxial (LPE) layers of Hg0.78Cd0.22Te grown on CdZnTe substrates are presented in this paper. In order to qualify these epilayers, 64 x 64 arrays of backside illuminated photovoltaic detector