Zobrazeno 1 - 10
of 22
pro vyhledávání: '"G. K. Safaraliev"'
Publikováno v:
Вестник Дагестанского государственного технического университета: Технические науки, Vol 38, Iss 3, Pp 15-20 (2016)
Method of magnetron sputtering targets polycrystalline SiC-AlN on substrates SiC and Al2O3 thin films received solid solutions (SiC)1-x(AlN)x. The methods of Xray and electron microscopy studies the structure and composition of films. There are facto
Externí odkaz:
https://doaj.org/article/9de1b5e0a6d244f7acf0010c30291bed
Autor:
A. S. Gusev, N. I. Kargin, S. M. Ryndya, G. K. Safaraliev, N. V. Siglovaya, M. O. Smirnova, I. O. Solomatin, A. O. Sultanov, A. A. Timofeev
Publikováno v:
Technical Physics. 66:869-877
Publikováno v:
Herald of Dagestan State University. 36:80-87
Autor:
G. K. Safaraliev, N. V. Siglovaya, S. M. Ryndya, A. O. Sultanov, N. I. Kargin, A. S. Gusev, A. A. Timofeev
Publikováno v:
Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques. 13:280-284
Experimental and theoretical studies of the processes of mesoporous-silicon carbonization during the formation of buffer layers for the subsequent epitaxy of 3C-SiC films and related wide-gap semiconductors are performed. Analytical expressions for t
Autor:
V. I. Altukhov, A. V. Sankin, V. F. Antonov, R. Kh Dadashev, G. K. Safaraliev, D. Z. Elimkhanov
Publikováno v:
IOP Conference Series: Materials Science and Engineering. 1064:012009
The paper presents models of bands (levels) in solid (SiC)1-x(AlN)x luminescence centers and n-SiC/p-(SiC)1-x(AlN)x heterostructures (light-emitting diodes). The diagram of (SiC)1-x(AlN)x energy gaps shows the positions of luminescence levels, subjec
Autor:
G. D. Kardashova, G. K. Safaraliev, R. R. Akhmedov, Sh. Sh. Shabanov, F. G. Al-Heyun, S. Sh. Shabanov, S. N. Emirov
Publikováno v:
Bulletin of the Russian Academy of Sciences: Physics. 80:500-503
Experimental measurements of the effect high pressure and temperature have on the thermal conductivity of silicon carbide SiC–BeO ceramics are presented. The pressure is varied in an interval of up to 400MPa; temperature, in the range of 273–523
Autor:
N. I. Kargin, G. K. Safaraliev, A. S. Gusev, A. O. Sultanov, N. V. Siglovaya, S. M. Ryndya, A. A. Timofeev
In this paper, an experimental and theoretical study of the processes of mesoporous silicon carbonization during the formation of buffer layers for the subsequent epitaxy of 3C-SiC films and related wide-band-gap semiconductors is performed. Experime
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::4e115b3e62c75271a1d3d05dc1605d33
Autor:
I. S. Kas’yanenko, V. I. Altukhov, A. V. Sankin, B. A. Bilalov, M. K. Kurbanov, G. K. Safaraliev
Publikováno v:
Russian Microelectronics. 44:404-409
A simple model of the metal–semiconductor contact that is nonlinear in the concentration of defects when the Schottky barrier is formed by the surface defect states Ei localized at the interface has been proposed. It has been shown that taking into
Publikováno v:
Vestnik Dagestanskogo Gosudarstvennogo Tehničeskogo Universiteta: Tehničeskie Nauki, Vol 38, Iss 3, Pp 15-20 (2016)
Method of magnetron sputtering targets polycrystalline SiC-AlN on substrates SiC and Al2O3 thin films received solid solutions (SiC)1-x(AlN)x. The methods of Xray and electron microscopy studies the structure and composition of films. There are facto
Publikováno v:
Inorganic Materials. 49:57-61
We have studied the structure, relative dielectric permittivity (ɛ), and dielectric loss tangent (tanδ) of SiC-AlN ceramic materials. The results demonstrate that both ɛ and tanδ are anomalously high in the composition range 30–50 wt % AlN at l