Zobrazeno 1 - 10
of 10
pro vyhledávání: '"G. E. van Dorssen"'
Publikováno v:
Journal of X-ray science and technology. 3(2)
The structure of Ni-C multilayer and single nickel layer samples has been analyzed before and after annealing, using two techniques: fluorescence EXAFS (F1EXAFS) at the Ni-K. edge and CuKα reflection. Annealing at a temperature of 450°C resulted in
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::45fd1f9d1ba0723853796bb16e457c36
https://pubmed.ncbi.nlm.nih.gov/21307440
https://pubmed.ncbi.nlm.nih.gov/21307440
Publikováno v:
Journal of X-ray science and technology. 1(2)
Soft x-ray emission spectra (250-875 eV) are presented for plasmas, produced by picosecond and nanosecond frequency-doubled Nd:YAG-glass laser pulses incident on 14 different target materials. The emitted spectra have been corrected for various appar
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::0a9ab573dbbb1f3598c657a0687f14a5
https://pubmed.ncbi.nlm.nih.gov/21307405
https://pubmed.ncbi.nlm.nih.gov/21307405
Publikováno v:
Journal of X-Ray Science and Technology. 3:109-117
The structure of Ni-C multilayer and single nickel layer samples has been analyzed before and after annealing, using two techniques: fluorescence EXAFS (F1EXAFS) at the Ni-K. edge and CuKα reflection. Annealing at a temperature of 450°C resulted in
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::71e5b21d5257b5efc390a4780a6081fc
https://doi.org/10.1016/0895-3996(92)90003-3
https://doi.org/10.1016/0895-3996(92)90003-3
Autor:
Howard A. Padmore, E.J. Puik, G. van der Laan, M. J. van der Wiel, J. Verhoeven, G. E. van Dorssen
Publikováno v:
Journal of Vacuum Science & Technology a-Vacuum Surfaces and Films, 9, 3142-3148
Two different pairs of x-ray reflecting multilayer coatings have been tested in a double crystal monochromator configuration. The two pairs consisted of Ni (0.4 nm)-C (1.85 nm) and NiSi (0.4 nm)-C (1.85 nm), both with 225 periods. In order to determi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::f8ac2659c2f3a572574a559636c688ac
https://doi.org/10.1116/1.577185
https://doi.org/10.1116/1.577185
Publikováno v:
Powder Diffraction. 21:170-170
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6faa66cc888b059598197414d96f7e17
https://doi.org/10.1154/1.2219784
https://doi.org/10.1154/1.2219784
Autor:
G. E. van Dorssen, D. C. Koningsberger
Publikováno v:
Physical Chemistry Chemical Physics (PCCP); Jul2003, Vol. 5 Issue 16, p3549-3556, 8p
Autor:
A. Verheul, P.F.M. Delmee, M. J. van der Wiel, W. J. J. Wolfis, G. E. van Dorssen, W. Kersbergen, Frederik Bijkerk, H. van Brug, E.J. Puik
Publikováno v:
Physics, Fabrication, and Applications of Multilayered Structures ISBN: 9781475700930
A prime application of figured multilayer structures as X-ray optics is the combination with a laser produced plasma. As a source of soft X-rays, a laser-plasma has proven its attractive properties: a high instantaneous brightness, good shot-to-shot
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::84fcc2e7e31da47543f115c11c9604d0
https://doi.org/10.1007/978-1-4757-0091-6_36
https://doi.org/10.1007/978-1-4757-0091-6_36
Publikováno v:
SPIE Proceedings.
Laser radiation can be used efficiently to generate X rays for lithographic imaging of submicron patterns, e.g. for VLSI device fabrication. Due to their short wavelength and high average power, excimer lasers show much potential for this application
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::afd3f32140596ab9b83a12ea92e2e9b1
https://doi.org/10.1117/12.950153
https://doi.org/10.1117/12.950153
Autor:
M. D. Roper, G. E. van Dorssen, Maurizio Sacchi, George A. Sawatzky, Kan-Cheung Cheung, Howard A. Padmore, D. Alders, T. Hibma, Jan Vogel, G. van der Laan
Publikováno v:
Scopus-Elsevier
Journal of Applied Physics, 82(6), 3120-3124. AMER INST PHYSICS
Journal of Applied Physics, 82(6), 3120-3124. AMER INST PHYSICS
We report on a study of grazing incidence absorption and reflection spectra of NiO in the region of the Ni 2p edge. The aim is to evaluate the distortion of the near edge spectrum by the critical angle behavior of individual components within the spe
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::611f1eb1fc83797933b4e7490f164369
http://www.scopus.com/inward/record.url?eid=2-s2.0-0031238141&partnerID=MN8TOARS
http://www.scopus.com/inward/record.url?eid=2-s2.0-0031238141&partnerID=MN8TOARS
Publikováno v:
Surface Science, 210, 69-84
We have developed a pump-and-probe method to detect structural changes in surfaces under pulsed laser irradiation, by means of changes in the soft X-ray reflectivity. First results of reflectivity measurements of Si surfaces at X-ray energies around
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::716100cebcf7919b91d3b7e13794f944
https://doi.org/10.1016/0167-2584(89)90785-8
https://doi.org/10.1016/0167-2584(89)90785-8