Zobrazeno 1 - 10
of 22
pro vyhledávání: '"G. Bostrup"'
Autor:
Priyalal Wijewarnasuriya, Jeffrey M. Peterson, D. D. Lofgreen, L. A. Almeida, Daeyeon Lee, G. Bostrup, R. N. Jacobs, Y. Chen, Andrew J. Stoltz, Scott M. Johnson, L. O. Bubulac, M. Jaime-Vasquez, M. Carmody, M. Reddy, J. D. Benson, A. Yulius, G. Brill, M. F. Vilela, J. K. Markunas, S. Couture, P. J. Smith
Publikováno v:
Journal of Electronic Materials. 43:3993-3998
State-of-the-art (112)B CdZnTe substrates were examined for near-surface tellurium precipitate-related defects. The Te precipitate density was observed to be fairly uniform throughout the bulk of the wafer, including the near-surface region. After a
Publikováno v:
Journal of Electronic Materials. 30:560-565
With the evolution of infrared arrays to over four million pixels, larger formats have demanded higher quality mercury cadmium telluride (MCT) wafers. Since single defects can easily degrade multiple diodes, high operability requires very homogeneous
Publikováno v:
Passive Sensors.
Publikováno v:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films. 5:3166-3170
This work reports on two significantly different methods to form junctions in Hg1−xCdxTe by ion implantation: a ‘‘displaced Hg diffusion source’’ for n‐on‐p junctions and an ‘‘implanted species diffusion source’’ for p‐on‐n
Publikováno v:
Applied Physics Letters. 39:336-338
An n‐channel metal‐insulator‐semiconductor charge‐coupled device has been successfully demonstrated in p‐type epitaxial Hg0.7Cd0.3Te (λco≃5.0 μm, 77 K) grown by liquid‐phase epitaxy on CdTe substrate. A three‐bit, three‐phase devi
Publikováno v:
Journal of Vacuum Science and Technology. 21:244-246
The electron mobility in n‐type Hg1−xCdxTe has been studied as a function of temperature in the vicinity of zero band‐gap crossing. The temperature range covered in these experiments was 5–300 K, and the samples studied were liquid phase epit
Autor:
G. Bostrup, W. E. Tennant, J. C. Robinson, J. Ratusnik, D. S. Lo, L. O. Bubulac, D. D. Edwall, J. C. Chen
Publikováno v:
Applied Physics Letters. 50:1586-1588
The first demonstrated achievement of p on n‐type activated junctions in HgCdTe material by arsenic ion implantation is reported. The junctions were formed by treating the implant as a finite diffusion source in the post‐implant anneals. The mate
Publikováno v:
MRS Proceedings. 90
Minority carrier lifetime measurements at 77K were carried out in ptype liquid phase epitaxial (LPE) Hg 1-xCdx Te/CdTe (x = 0.22) using the photoconductive decay technique. Lifetimes of 20 to 7000 ns were obtained in samples with hole concentrations,
Publikováno v:
26th Aerospace Sciences Meeting.
The role of gravity-induced phenomena in bulk CdTe crystal growth is studied with emphasis placed on the negative effects of buoyancy-driven convection, container effects, and hydrostatic pressure. An earth-bound crystal growth data base utilizing NA
Publikováno v:
IEEE Transactions on Electron Devices. 28:1250-1251