Zobrazeno 1 - 10
of 12
pro vyhledávání: '"G. A. Porkolab"'
Publikováno v:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films. 15:616-621
A chemically assisted ion beam etching system has been developed which performs high quality, highly anisotropic etching of AlGaAs/GaAs at relatively low ion energies (200 eV). The use of three grid ion optics in a Kaufman ion source allows etching a
Publikováno v:
Digest IEEE/Leos 1996 Summer Topical Meeting. Advanced Applications of Lasers in Materials and Processing.
Wavelength division multiplexing (WDM) is rapidly becoming a mainstream technology for high capacity optical communications. One of the critical components needed in WDM systems is a multi-wavelength laser array. The external cavity laser array confi
Autor:
G. A. Porkolab, E. D. Wolf
Publikováno v:
Applied Physics Letters. 61:2045-2047
High quality etch masks for nanometer plasma processing can be formed from thin films of semimetallic amorphous carbon that are deposited by electron beam sublimation of graphitic carbon. These films are amorphous, hard, semimetallic, and mirror‐re
Autor:
G. A. Porkolab, E. D. Wolf
Publikováno v:
Applied Physics Letters. 56:2319-2321
We report on the spatially dependent enhanced etch rate of SiO2 in a CF4 planar reactive ion etcher due to the presence of the compounds GaAs or InP, or the single elements Ti, V, Nb, Ta, Cr, Mo, W, Ni, Pd, Pt, Cu, Ag, Au, Al, Ga, In, or Ge. The etch
Autor:
G. A. Porkolab, O. King, S. Agarwala, Y. J. Chen, Seyed Ahmad Tabatabaei, F.G. Johnson, Dennis Stone, S.A. Merritt, Mario Dagenais
Publikováno v:
MRS Proceedings. 477
This paper describes in detail a surface preparation, and post-etch removal technique developed for InGaAs sidewalls. It illustrates the results demonstrating the effect of sidewall post-etch, surface preparation, and surface passivation on the perfo
Autor:
Mario Dagenais, Wenhua Lin, Haifeng Li, John Hryniewicz, Dennis Stone, Yung Jui Chen, G. A. Porkolab, Yen-Ping Ho
Publikováno v:
SPIE Proceedings.
Wavelength Division Multiplexing (WDM) has become the technology of choice for meeting the rapid increase in demand for bandwidth and capacity in telecommunication and computer networking systems. One of the key enabling technologies for WDM systems
Autor:
Seyed Ahmad Tabatabaei, Y. J. Chen, Dennis Stone, W. T. Beard, Russell E. Frizzell, F.G. Johnson, S. Agarwala, G. A. Porkolab, Mario Dagenais, O. King
Publikováno v:
Scopus-Elsevier
Pyrolyzation of photolithographically patterned photoresist on semiconductor substrates such as silicon, gallium arsenide, and indium phosphide, results in a convex-shaped, chemically inert, temporary form that functions as a mold upon which to lift-
Publikováno v:
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures. 13:1984
A focused electron beam was found, in the presence of oxygen gas, to induce the etching of a plasma enhanced chemical vapor deposited amorphous hydrogenated carbon (PECVD a‐C:H) film. This reaction was used to pattern the film directly, eliminating
Autor:
G. A. Porkolab, E. D. Wolf
Publikováno v:
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures. 11:2552
A self‐aligned fabrication process is presented for making surface‐emitting high‐power AlGaAs/GaAs GRIN‐SCH‐SQW semiconductor laser sources designed to produce ≳1 W optical output at the nominal GaAs wavelength of 830 nm. The process uses
Autor:
E. D. Wolf, G. A. Porkolab
Publikováno v:
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures. 10:2681
Smoothness of etched facets at all angles is a critical requirement for photonic devices in such materials as AlGaAs/GaAs which are etched at variable angles by directed ion beam/reactive gas etching systems such as chemically assisted ion beam etchi