Zobrazeno 1 - 10
of 27
pro vyhledávání: '"G V Spivak"'
Autor:
G. V. Spivak, E. I. Rau
Publikováno v:
Scanning. 3:27-34
Methods used in metrology of two-dimensional magnetic microfields and based on direct interaction of the electron beam of scanning electron microscope (SEM) with the studied fields are described. An analytical expression for calculating the value of
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ef1306470c68f568a49184fa264ae2f6
https://doi.org/10.1002/sca.4950030104
https://doi.org/10.1002/sca.4950030104
Publikováno v:
Scanning. 5:123-128
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::84b1ac2ad27d2a1d5b821f617b3baabc
https://doi.org/10.1002/sca.4950050302
https://doi.org/10.1002/sca.4950050302
Publikováno v:
Scanning. 3:242-248
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0f0b1a013c13f8be3c42252bf92b79bb
https://doi.org/10.1002/sca.4950030321
https://doi.org/10.1002/sca.4950030321
Autor:
E. I. Rau, G. V. Spivak
Publikováno v:
Physica Status Solidi (a). 55:589-597
Some aspects are considered of the methods for measuring (with scanning electron microscopes) the surface potentials using the electron energy analysis. The micropotential distribution is automatically readout at sufficiently high sensitivity and loc
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a3c724c4d4de5e99c62c1dea0c628fb6
https://doi.org/10.1002/pssa.2210550228
https://doi.org/10.1002/pssa.2210550228
Publikováno v:
Scanning. 3:181-192
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f64e940b5801572c6245e1ca555bdb99
https://doi.org/10.1002/sca.4950030309
https://doi.org/10.1002/sca.4950030309
Publikováno v:
Journal of Microscopy. 135:1-12
SUMMARY The combination of a scanning electron microscope and a microcomputer can be used to carry out automatic, quantitative, morphological analysis of a wide range of samples. A system implemented around a commercially available 8-bit computer and
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::bf1d02e6732d5bfdd16324aeaaf84d3c
https://doi.org/10.1111/j.1365-2818.1984.tb04644.x
https://doi.org/10.1111/j.1365-2818.1984.tb04644.x
Publikováno v:
Journal of Microscopy. 135:13-24
SUMMARY The application of automatic image analysis image techniques in the SEM to massive samples with complex morphology requires a careful choice of the imaging mode and detector geometry used. Thus the quantitative analysis of conjugated surfaces
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8e0030886df90481c8b37c8cee469a51
https://doi.org/10.1111/j.1365-2818.1984.tb04645.x
https://doi.org/10.1111/j.1365-2818.1984.tb04645.x
Publikováno v:
Uspekhi Fizicheskih Nauk. 148:689-717
A review of the applications of the scanning electron microscope cathodoluminescent mode is given. Particular attention is devoted to the kind of information that can be obtained by modifying the method in different ways, the problems of spatial reso
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::a1f5d268f4e5f59c81652b5a6d7e0f2e
https://doi.org/10.3367/ufnr.0148.198604e.0689
https://doi.org/10.3367/ufnr.0148.198604e.0689
Publikováno v:
Scanning. 3:262-272
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1d48b4eacb3c1e52ccf50498a9845e7e
https://doi.org/10.1002/sca.4950030402
https://doi.org/10.1002/sca.4950030402
Publikováno v:
Soviet Journal of Quantum Electronics. 5:1069-1074
An investigation was made of catastrophic degradation of electron-beam-pumped gallium arsenide lasers operating at temperatures of 80 and 300°K. The critical radiation density in the semiconductor resonator resulting in its damage ranged from 2 to 1
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::dffb6809e4e1196f5e79fb61cce977fd
https://doi.org/10.1070/qe1975v005n09abeh011900
https://doi.org/10.1070/qe1975v005n09abeh011900