Zobrazeno 1 - 10
of 245
pro vyhledávání: '"G Stratigopoulos"'
Publikováno v:
IEEE Design & Test. 40:8-58
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2082097615852a66fd5166e0e849280b
https://doi.org/10.1109/mdat.2023.3241116
https://doi.org/10.1109/mdat.2023.3241116
Publikováno v:
IEEE Design & Test. 40:5-7
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f6c428a8e3666b7e7b3adea6e73e327b
https://doi.org/10.1109/mdat.2023.3241114
https://doi.org/10.1109/mdat.2023.3241114
Autor:
Haralampos-G. Stratigopoulos, Julian Leonhard, Ozgur Sinanoglu, Hassan Aboushady, Shadi Turk, Nimisha Limaye, Alan Rodrigo Diaz Rizo, Alhassan Sayed
Publikováno v:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 41:2449-2462
The design and manufacturing steps of a chip typically involve several parties. For example, a chip may comprise several third-party Intellectual Property (IP) cores and the Integrated Circuit (IC) fabrication may be outsourced to a third-party found
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9b28a3aa097e113668535bfc973c7b5e
https://doi.org/10.1109/tcad.2021.3111550
https://doi.org/10.1109/tcad.2021.3111550
Publikováno v:
IEEE Transactions on Circuits and Systems II: Express Briefs. 69:3169-3173
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b63ba7c73d83c3b5a47cd0166bfefcb0
https://doi.org/10.1109/tcsii.2022.3165709
https://doi.org/10.1109/tcsii.2022.3165709
Publikováno v:
IEEE Transactions on Dependable and Secure Computing. :1-16
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1b15842c4ea6fc3277a75a9addcb6d38
https://doi.org/10.1109/tdsc.2022.3218507
https://doi.org/10.1109/tdsc.2022.3218507
Autor:
Haralampos-G. Stratigopoulos
Publikováno v:
Machine Learning Support for Fault Diagnosis of System-on-Chip ISBN: 9783031196386
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7654a683b730016a9c5781e22c9f099e
https://doi.org/10.1007/978-3-031-19639-3_7
https://doi.org/10.1007/978-3-031-19639-3_7
Autor:
Michele Portolan, Antonios Pavlidis, Giorgio Di Natale, Eric Faehn, Haralampos-G. Stratigopoulos
Publikováno v:
2022 IEEE International Test Conference (ITC).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::349503f8a026723fdf81f52386b6254f
https://doi.org/10.1109/itc50671.2022.00068
https://doi.org/10.1109/itc50671.2022.00068
Autor:
Eric Faehn, Antonios Pavlidis, Haralampos-G. Stratigopoulos, Anand Kumar, Marie-Minerve Louerat
Publikováno v:
IEEE Transactions on Circuits and Systems I: Regular Papers. 68:2580-2593
We propose a Built-In Self-Test (BIST) paradigm for analog and mixed-signal (A/M-S) Integrated Circuits (ICs), called symmetry-based BIST ( SymBIST ). SymBIST exploits inherent symmetries in an A/M-S IC to construct signals that are invariant by defa
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4229ebfdb8bb99f09576688444993f30
https://doi.org/10.1109/tcsi.2021.3067180
https://doi.org/10.1109/tcsi.2021.3067180
Publikováno v:
2022 IEEE 40th VLSI Test Symposium (VTS).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::32fa3c1950c96dcdffdda6cb75d5a07a
https://doi.org/10.1109/vts52500.2021.9794208
https://doi.org/10.1109/vts52500.2021.9794208