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Autor:
Yu V Likholetov, R. A. Chakalov, Orest Vendik, V. Yu. Davydov, A.B. Kozyrev, I T Serenkov, G O Dzjuba, R N Il'in, S. F. Karmanenko, M. V. Belousov, K F Njakshev
Publikováno v:
Superconductor Science and Technology. 6:23-29
The structure and crystallographic orientation of YBa2Cu3O7- delta films on BaxSr1-xTiO3/MgO heteroepitaxial layers were investigated by the conventional methods of electron diffraction, electron microscopy and by specific methods of Raman scattering