Zobrazeno 1 - 10
of 46
pro vyhledávání: '"G D Pitt"'
Autor:
B. J. E. Smith, G. D. Pitt, K. P. J. Williams, Kurt J. Baldwin, R. Bennett, S. Webster, R.W. Bormett, Y.Y. Yang, D.N. Batchelder, Ian P. Hayward
Publikováno v:
IEE Proceedings - Science, Measurement and Technology. 152:241-318
Raman instrumentation design has improved radically in efficiency and ease of use over the past 15 years. New technologies made this possible with introduction of the first commercial high-efficiency (high speed) Raman systems incorporating low power
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c429c8f6e2b1ddc905cb31426a582e68
https://doi.org/10.1049/ip-smt:20050015
https://doi.org/10.1049/ip-smt:20050015
Publikováno v:
Journal of Raman Spectroscopy. 32:840-846
Raman scattering properties from various GaN thin films grown on sapphire by metalorganic chemical vapor deposition were studied. Visible micro-Raman measurements show different mode behaviors with different laser incidence configurations. Raman line
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::eacf2942cac056e8cdcccbb23415dda9
https://doi.org/10.1002/jrs.765
https://doi.org/10.1002/jrs.765
Autor:
P. G. Partridge, Michael N. R. Ashfold, I. P. Hayward, Neil A. Fox, Paul W May, M. P. Knapper, John W Steeds, G. Meaden, G. D. Pitt, Wang Nang Wang
Publikováno v:
Physica Status Solidi (a). 154:255-268
This report describes the results of a number of different, but related, laser Raman studies on various CVD diamond samples. It attempts to show the versatility of Raman spectroscopy as a diagnostic tool for the quality of diamond films, by demonstra
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::20e31337e7a1ad2e7a54cc1bd063aea6
https://doi.org/10.1002/pssa.2211540119
https://doi.org/10.1002/pssa.2211540119
Publikováno v:
Optical and Quantum Electronics. 27:135-139
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1ec5b041a31838133af9940c48a7c166
https://doi.org/10.1007/bf00367950
https://doi.org/10.1007/bf00367950
Publikováno v:
Applied Spectroscopy. 48:232-235
Confocal Raman microspectroscopy has previously used pinholes placed at the back focal plane of the microscope to provide depth resolution along the optical axis. The process of optimizing the pinhole alignment can often be difficult and time-consumi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::da13374de32b6e93b70e483ccbec312b
https://doi.org/10.1366/0003702944028407
https://doi.org/10.1366/0003702944028407
Publikováno v:
Journal of Raman Spectroscopy. 25:131-138
Raman spectroscopy is steadily growing in importance in the industrial analytical laboratory. The nature of the equipment, its ease of use and its cost are making the method more acceptable to non-experts. This paper illustrates the capabilities of a
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::410f13b99bbd40ac1582a14d234ac323
https://doi.org/10.1002/jrs.1250250119
https://doi.org/10.1002/jrs.1250250119
Autor:
Martin Kuball, Soo Jin Chua, Zhe Chuan Feng, G. D. Pitt, Ken P. J. Williams, Wei Liu, Wei Wang, Geraint A. Evans
Publikováno v:
SPIE Proceedings.
GaN thin film materials, un-doped, Si- and Mg-doped, have been grown on c-sapphire substrates by low pressure metalorganic chemical vapor deposition, and have been characterized by micro-Raman scattering ((mu) -RS) and micro- photoluminescence ((mu)
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8ba25e239581818f143d31b797d0b33f
https://doi.org/10.1117/12.401629
https://doi.org/10.1117/12.401629
Autor:
P. Extance, G. D. Pitt
Publikováno v:
Measurement + Control, Vol 17 (1984)
Externí odkaz:
https://doaj.org/article/6348ab2df6ff47c6bf168782a2ab3208
Autor:
G. D. Pitt
Publikováno v:
SPIE Proceedings.
Calibration standards for volumetric accuracies of CMM and machine tools are described. Automated measurement techniques using laser interferometers can speed up measurement time.© (1993) COPYRIGHT SPIE--The International Society for Optical Enginee
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9f875ba7a2355a35478ba7142393f72f
https://doi.org/10.1117/12.168059
https://doi.org/10.1117/12.168059
Autor:
G. D. Pitt
Publikováno v:
SPIE Proceedings.
Calibration of machine tools and co-ordinate measurement machines can be a lengthy business. New developments, based on linear interterometry, and novel software methods have drastically reduced the time required for machine calibrations and installa
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::237f94ad7d674cbd73b58def424dffce
https://doi.org/10.1117/12.57759
https://doi.org/10.1117/12.57759