Zobrazeno 1 - 8
of 8
pro vyhledávání: '"Fumiyasu Asai"'
Autor:
Taketora Shiraishi, Koji Kawamoto, Kazuyuki Ishikawa, Hisakazu Sato, Fumiyasu Asai, Eiichi Teraoka, Toru Kengaku, Hidehiro Takata, Takeshi Tokuda, Kouichi Nishida, Kazunori Saitoh
Publikováno v:
Low-Power CMOS Design; 1998, p437-440, 4p
Publikováno v:
Japanese Journal of Applied Physics. 24:92
Crystal-and evaporated film-type KCI were irradiated with X-rays and studied for optically stimulated exoelectron emission (OSEE). Special attention was paid to sample treatment in a clean high vacuum system and to the charging of samples. Upon study
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::88a743a7d6999601febb8f92bd3795aa
https://doi.org/10.7567/jjaps.24s4.92
https://doi.org/10.7567/jjaps.24s4.92
Autor:
Shiraishi, T., Kawamoto, K., Ishikawa, K., Sato, H., Asai, F., Teraoka, E., Kengaku, T., Takata, H., Tokuda, T., Nishida, K., Saitoh, K.
Publikováno v:
Proceedings of Custom Integrated Circuits Conference; 1996, p371-374, 4p
Autor:
Takata, H., Komori, S., Tamura, T., Asai, F., Satoh, H., Ohno, T., Tokuda, T., Nishikawa, H., Terada, H.
Publikováno v:
IEEE Journal of Solid-State Circuits; 1990, Vol. 25 Issue 1, p95-99, 5p
Autor:
Yamasaki, T., Shima, K., Komori, S., Takata, H., Tamura, T., Asai, F., Ohno, T., Tomisawa, O., Terada, H.
Publikováno v:
IEEE Journal of Solid-State Circuits; 1989, Vol. 24 Issue 4, p933-937, 5p
Autor:
Komori, S., Takata, H., Tamura, T., Asai, F., Ohno, T., Tomisawa, O., Yamasaki, T., Shima, K., Asada, K., Terada, H.
Publikováno v:
IEEE Journal of Solid-State Circuits; 1988, Vol. 23 Issue 1, p111-117, 7p
Autor:
Komori, S., Takata, H., Tamura, T., Asai, F., Ohno, T., Tomisawa, O., Yamasaki, T., Shima, K., Nishikawa, H., Terada, H.
Publikováno v:
IEEE International Solid-State Circuits Conference, 1989 ISSCC Digest of Technical Papers; 1989, p46-47, 2p
Autor:
Kim, S., Sridhar, R.
Publikováno v:
Proceedings of 1997 IEEE International Symposium on Circuits & Systems Circuits & Systems in the Information Age ISCAS '97; 1997, Issue 3, p1824-1824, 1p