Výsledky vyhledávání - "Fumio Tsuchiya"

Akademický článek

PREFABRICATED BUILDING OF PANEL STRUCTURE AT SYOWA STATION

Autor: Fumio TSUCHIYA

Publikováno v: Antarctic Record, Iss 26, Pp 2087-2108 (1966)

A prefabricated building was designed in 1965 by the Committee for Antarctic Buildings and built in 1966 at Syowa Station. This building is of box-frame structure, which can be easily assembled in short time for multi-purpose establishment in the Ant

Externí odkaz: https://doaj.org/article/4f7c2660b0f64cf4827d33d413c4701d

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Wear‐out stress monitor utilising temperature and voltage sensitive ring oscillators

Autor: Koji Nii, Takeshi Okagaki, Koji Shibutani, Fumio Tsuchiya, Kan Takeuchi, Masaki Shimada

Publikováno v: IET Circuits, Devices & Systems. 12:182-188

The authors propose an on-chip wear-out monitoring technique, which is based on monitoring the environmental conditions experienced by a digital circuit. The frequency of the T-sensitive ring oscillator (RO) emulates the wear-out stress strength caus

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::0736b5649f489b165360e78349e16d50
https://doi.org/10.1049/iet-cds.2017.0153

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Experimental Implementation of 8.9Kgate Stress Monitor in 28nm MCU Along with Safety Software Library for IoT Device Maintenance

Autor: Daisuke Oshida, Koji Shibutani, Ota Naoya, Konishi Shinya, Kan Takeuchi, Tomohiro Iwashita, Tetsuya Kokubun, Fumio Tsuchiya, Masaki Shimada, Takashi Yasumasu

Publikováno v: IRPS

The on-chip stress monitor was experimentally implemented in a 28 nm automotive micro-controller-unit (MCU) to demonstrate the contribution to long-term fatigue monitoring of the MCU as well as short-term anomaly finding of the system. The monitor co

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::1f29fdfe46a2c4b228a62ebe49ee7823
https://doi.org/10.1109/irps.2019.8720583

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FEOL/BEOL wear-out estimator using stress-to-frequency conversion of voltage/temperature-sensitive ring oscillators for 28nm automotive MCUs

Autor: Fumio Tsuchiya, Takeshi Okagaki, Koji Shibutani, Koji Nii, Masaki Shimada, Kan Takeuchi

Publikováno v: ESSCIRC

We propose wear-out estimator of remaining lifetime, which consists of two types of custom ring oscillators (ROs) and cumulative stress counters only. This on-chip estimator operates independently without disruption of MCU main operations and is aime

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::825629a253b851e6951fc74b20e795aa
https://doi.org/10.1109/esscirc.2016.7598293

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