Zobrazeno 1 - 4
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pro vyhledávání: '"Fumiko Ota"'
Publikováno v:
SPIE Proceedings.
A negative-CAR for EB reticle fabrication beyond 100 nm node is needed, which is superior in performance such as resolution, sensitivity, pattern quality, CD movement by process delays (PCD, PED) and process latitudes. We started preliminary screenin
Publikováno v:
21st Annual BACUS Symposium on Photomask Technology.
Publikováno v:
SPIE Proceedings.
This paper will describe resist screening results for iP3500/3600 replacement for the advanced laser reticle fabrication, resist coating thickness optimization proposal for the next generation as well. THMR-M100 (TOK) showed the best pattern profile
Autor:
Yasunori Yokoya, Hideo Kobayashi, Takao Higuchi, Keishi Asakawa, Akinori Kurikawa, Tadashi Sakurai, Masahiro Hashimoto, Fumiko Ota
Publikováno v:
SPIE Proceedings.