Zobrazeno 1 - 4
of 4
pro vyhledávání: '"Fulong Qiao"'
Autor:
Jihong Zhang, Kang Huang, Yu Jiang, Zhigang Zhang, Yushan, Fulong Qiao, Yiling Sun, Keqiang He
Publikováno v:
2020 China Semiconductor Technology International Conference (CSTIC).
Due to the continuing improvements of CMOS image sensor (CIS) technology, the back side-illumination (BSI) structure was involved to overcome optical characteristics deterioration in smaller pixels. In BSI structure, bonding loop is necessary to adhe
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d30dde7245cee43468d5bcb276305abf
https://doi.org/10.1109/cstic49141.2020.9282503
https://doi.org/10.1109/cstic49141.2020.9282503
Publikováno v:
2014 IEEE 28th Convention of Electrical & Electronics Engineers in Israel (IEEEI); 2014, p1-4, 4p
Publikováno v:
Journal of Applied Physiology; Sep2005, Vol. 99 Issue 3, p799-806, 8p, 1 Diagram, 4 Charts, 13 Graphs
Publikováno v:
Journal of Applied Physiology; Sep2005, Vol. 99 Issue 3, p788-798, 11p, 2 Diagrams, 1 Chart, 10 Graphs