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Autor:
Fukuhara, Ryoga, Morishita, Makoto, Katagiri, Takahiro, Kawai, Masatoshi, Nagai, Toru, Hoshino, Tetsuya
In this paper, support vector machine (SVM) performance was assessed utilizing a quantum-inspired complementary metal-oxide semiconductor (CMOS) annealer. The primary focus during performance evaluation was the accuracy rate in binary classification
Externí odkaz:
http://arxiv.org/abs/2404.15752