Zobrazeno 1 - 10
of 166
pro vyhledávání: '"Fujio Wakaya"'
Publikováno v:
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 456:12-15
An effect of sample bias voltage on analysis time and time resolution of a single-event three-dimensional time-of-flight (ToF) Rutherford backscattering spectrometry (RBS) was evaluated with both experiment and simulation. Fluctuations of trajectorie
An X-ray charge neutralizer using a screen-printed carbon-nanotube field emitter is demonstrated to show the possibility of a large-area flat-panel charge neutralizer, although the device dimensions in the present work are not very large. The X-ray y
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::6421dba52fe3ad359addefa2d52dc15f
http://arxiv.org/abs/1812.09831
http://arxiv.org/abs/1812.09831
Autor:
Masayuki Abe, Satoshi Abo, Fujio Wakaya, Hayato Yamashita, Yuji Miyato, Shinobu Onoda, Kenichi Tani
Publikováno v:
2018 22nd International Conference on Ion Implantation Technology (IIT).
The lateral distribution of the charge generated in silicon by a 15 MeV oxygen-ion incidence was experimentally measured. The lateral radius of the charge region generated because of this 15 MeV oxygen-ion incidence was 300–400 nm, which is much wi
Publikováno v:
2018 31st International Vacuum Nanoelectronics Conference (IVNC).
We calculated temperature, polarization, charge,and potential of Laser-Irradiated pyroelectric crystal and reproduced the experiments. These calculated results suggest that the time-dependent radial distributions of surface charge and electric field
Graphene on a SiO$_2$/Si substrate was removed by ultraviolet pulsed laser irradiation. Threshold laser power density to remove graphene depended on the graphene thickness. The mechanism is discussed using kinetic energy of thermal expansion of the s
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::6982b1596f1f149cb74a627ceea9cc73
Publikováno v:
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 348:29-33
An improvement of a depth resolution and a detection efficiency in single-event three-dimensional time-of-flight (TOF) Rutherford backscattering spectrometry (RBS) is discussed on both simulation and experiment by control of secondary electron trajec
Publikováno v:
MATERIALS TRANSACTIONS. 56:1310-1313
Publikováno v:
Surface and Interface Analysis. 46:1192-1195
An analysis technique for an ultra shallow junction in shrunk semiconductor devices was developed using medium energy ion scattering (MEIS) time-of-flight (TOF) elastic recoil detection analysis (ERDA). The energy of the recoiled and forward-scattere
Publikováno v:
Applied Physics Letters. 113:261601
Magnetic force microscopy (MFM) allows detection of stray magnetic fields around magnetic materials and the two-dimensional visualization of these fields. This paper presents a theoretical analysis of the oscillations of an MFM tip above a thin film
Autor:
Mikio Takai, Hidetaka Shimawaki, Hidenori Mimura, Fujio Wakaya, Masayoshi Nagao, Yoichiro Neo
Publikováno v:
2016 29th International Vacuum Nanoelectronics Conference (IVNC).
Volcano-structured p-type silicon field emitter arrays have been fabricated by etch-back technique and investigated the photoresponse characteristics of electron emission excited by laser pulses. We have observed the current pulses from the device wi