Zobrazeno 1 - 10
of 61
pro vyhledávání: '"Fubin Song"'
Publikováno v:
The Journal of Organic Chemistry. 88:3353-3358
Publikováno v:
2022 IEEE 24th Electronics Packaging Technology Conference (EPTC).
Publikováno v:
Microelectronics Reliability. 54:435-446
Cu 6 Sn 5 and Cu 3 Sn are common intermetallic compounds (IMCs) found in Sn–Ag–Cu (SAC) lead-free solder joints with OSP pad finish. People typically attributed the brittle failure to excessive growth of IMCs at the interface between the solder j
Publikováno v:
Structural Dynamics of Electronic and Photonic Systems
Publikováno v:
Scopus-Elsevier
The enforcement of environmental legislation is pushing electronic products to take lead-free solder alloys as the substitute of traditional lead-tin solder alloys. Applications of such alloys require a better understanding of their mechanical behavi
Publikováno v:
Journal of Electronic Packaging. 136
SnCuNi is one of the most common ternary intermetallic compounds formed in the Sn-based solder joint, and its formation and properties can be greatly influenced by the amount of Ni. Ni can participate in the interfacial reaction and diffuse into the
Publikováno v:
2013 IEEE 63rd Electronic Components and Technology Conference.
Hot pin pull test is frequently used for the pad crater evaluation. Although it carries several merits, it still has certain drawbacks such as time consuming and causing potential thermal impact on the PCB during the pin attachment process. In this p
Publikováno v:
2012 14th International Conference on Electronic Materials and Packaging (EMAP).
With the advancement of the motherboard multiple functions, more and more connectors are mounted on the Printed Circuit Board (PCB) to interconnect electronic components or sub-functional daughtercards. Among different types of connectors, Straddle M
Publikováno v:
2012 14th International Conference on Electronic Materials and Packaging (EMAP).
Hot pin pull test is one of the testing methods frequently used in the pad crater evaluation. Although it carries several merits comparing with the other testing methods, it still has certain drawbacks such as time consuming and the potential thermal