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pro vyhledávání: '"Frittoli, Luca"'
Autor:
Notarianni, Michelangelo Olmo Nogara, Leveni, Filippo, Stucchi, Diego, Frittoli, Luca, Boracchi, Giacomo
We present Kernel-QuantTree Exponentially Weighted Moving Average (KQT-EWMA), a non-parametric change-detection algorithm that combines the Kernel-QuantTree (KQT) histogram and the EWMA statistic to monitor multivariate data streams online. The resul
Externí odkaz:
http://arxiv.org/abs/2410.13778
Autor:
Cao, Yunkang, Zhang, Jiangning, Frittoli, Luca, Cheng, Yuqi, Shen, Weiming, Boracchi, Giacomo
Zero-shot anomaly detection (ZSAD) targets the identification of anomalies within images from arbitrary novel categories. This study introduces AdaCLIP for the ZSAD task, leveraging a pre-trained vision-language model (VLM), CLIP. AdaCLIP incorporate
Externí odkaz:
http://arxiv.org/abs/2407.15795
We introduce Class Distribution Monitoring (CDM), an effective concept-drift detection scheme that monitors the class-conditional distributions of a datastream. In particular, our solution leverages multiple instances of an online and nonparametric c
Externí odkaz:
http://arxiv.org/abs/2210.08470
Publikováno v:
Pattern Recognition 153 (2024) 110557
Deep neural networks require specific layers to process point clouds, as the scattered and irregular location of 3D points prevents the use of conventional convolutional filters. We introduce the composite layer, a flexible and general alternative to
Externí odkaz:
http://arxiv.org/abs/2209.11796
We address the problem of online change detection in multivariate datastreams, and we introduce QuantTree Exponentially Weighted Moving Average (QT-EWMA), a nonparametric change-detection algorithm that can control the expected time before a false al
Externí odkaz:
http://arxiv.org/abs/2208.14801
Publikováno v:
Pattern Recognition Volume 124, April 2022, 108488
The chips contained in any electronic device are manufactured over circular silicon wafers, which are monitored by inspection machines at different production stages. Inspection machines detect and locate any defect within the wafer and return a Wafe
Externí odkaz:
http://arxiv.org/abs/2208.14071
Detecting anomalous regions in images is a frequently encountered problem in industrial monitoring. A relevant example is the analysis of tissues and other products that in normal conditions conform to a specific texture, while defects introduce chan
Externí odkaz:
http://arxiv.org/abs/2208.14045
Publikováno v:
In Pattern Recognition September 2024 153
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Deep neural networks require specific layers to process point clouds, as the scattered and irregular location of points prevents us from using convolutional filters. Here we introduce the composite layer, a new convolutional operator for point clouds
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::8688d6f432ace7e25acb09e1b0a7299f
http://arxiv.org/abs/2209.11796
http://arxiv.org/abs/2209.11796