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A Cytotaxonomic Study of Bouteloua curtipendula and B. uniflora

Autor: Freter, L. Ernest, Brown, Walter V.

Publikováno v: Bulletin of the Torrey Botanical Club, 1955 Mar 01. 82(2), 121-130.

Externí odkaz: https://www.jstor.org/stable/2481828

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3D-printed facet-attached optical elements for beam shaping in optical phased arrays.

Autor: Singer S, Xu Y, Skacel ST, Bao Y, Zwickel H, Maier P, Freter L, Dietrich PI, Kaschel M, Menzel C, Randel S, Freude W, Koos C

Publikováno v: Optics express [Opt Express] 2022 Dec 19; Vol. 30 (26), pp. 46564-46574.

Electrostatic Shaping of Magnetic Transition Regions in La_{0.7}Sr_{0.3}MnO_{3}.

Autor: Lan Q; Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons (ER-C 1) and Peter Grünberg Institut (PGI-5), Forschungszentrum Jülich GmbH, 52425 Jülich, Germany.; National Center for Electron Microscopy in Beijing, Key Laboratory of Advanced Materials (MOE), School of Materials Science and Engineering, Tsinghua University, Beijing 100084, People's Republic of China., Wang C; Department of Physics, Southern University of Science and Technology, Shenzhen 518055, People's Republic of China., Jin L; Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons (ER-C 1) and Peter Grünberg Institut (PGI-5), Forschungszentrum Jülich GmbH, 52425 Jülich, Germany., Schnedler M; Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons (ER-C 1) and Peter Grünberg Institut (PGI-5), Forschungszentrum Jülich GmbH, 52425 Jülich, Germany., Freter L; Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons (ER-C 1) and Peter Grünberg Institut (PGI-5), Forschungszentrum Jülich GmbH, 52425 Jülich, Germany., Fischer K; Department of Mechanical and Electrical Engineering, National Institute of Technology, Tokuyama College, Gakuendai, Shunan, Yamaguchi, 745-8585, Japan., Caron J; Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons (ER-C 1) and Peter Grünberg Institut (PGI-5), Forschungszentrum Jülich GmbH, 52425 Jülich, Germany., Wei XK; Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons (ER-C 1) and Peter Grünberg Institut (PGI-5), Forschungszentrum Jülich GmbH, 52425 Jülich, Germany., Denneulin T; Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons (ER-C 1) and Peter Grünberg Institut (PGI-5), Forschungszentrum Jülich GmbH, 52425 Jülich, Germany., Kovács A; Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons (ER-C 1) and Peter Grünberg Institut (PGI-5), Forschungszentrum Jülich GmbH, 52425 Jülich, Germany., Ebert P; Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons (ER-C 1) and Peter Grünberg Institut (PGI-5), Forschungszentrum Jülich GmbH, 52425 Jülich, Germany., Zhong X; TRACE EM Unit and Department of Materials Science and Engineering, City University of Hong Kong, Kowloon 999077, Hong Kong SAR, People's Republic of China.; City University of Hong Kong, Shenzhen Futian Research Institute, Shenzhen 518048, People's Republic of China.; Nanomanufacturing Laboratory, City University of Hong Kong, Shenzhen Research Institute, Shenzhen 518057, People's Republic of China., Dunin-Borkowski RE; Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons (ER-C 1) and Peter Grünberg Institut (PGI-5), Forschungszentrum Jülich GmbH, 52425 Jülich, Germany.

Publikováno v: Physical review letters [Phys Rev Lett] 2022 Jul 29; Vol. 129 (5), pp. 057201.