Zobrazeno 1 - 10
of 38
pro vyhledávání: '"Frederick A. Hanser"'
Autor:
Bronislaw K. Dichter, Gary E. Galica, Frederick A. Hanser, Douglas B. Carssow, Chadwick D. Lindstrom, James D. Sullivan
Publikováno v:
SPIE Proceedings.
The Teledyne microdosimeter is a novel miniature dosimeter that has become recently available to satellite manufacturers and programs to provide awareness of the total radiation dose received by the satellite and its associated subsystems. A characte
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::52f3622a02756436efd8007fef8d1935
https://doi.org/10.1117/12.893814
https://doi.org/10.1117/12.893814
Publikováno v:
IEEE Transactions on Nuclear Science. 40:252-255
An instrument for measurement of high energy electrons (1-10 MeV) in the Earth's radiation belts has been designed, calibrated and flown on-board the CRRES spacecraft. The instrument uses a triple coincidence arrangement with two solid state detector
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::64ee6296589f681f9f25339bdb19e9a9
https://doi.org/10.1109/23.212350
https://doi.org/10.1109/23.212350
Autor:
John F. Seely, Glenn E. Holland, Jack C. Rife, Raj Korde, J.L. Weaver, John C. Wise, Frederick A. Hanser
Publikováno v:
SPIE Proceedings.
Silicon photodiode detectors with multilayer coatings were characterized using synchrotron radiation. The coatings were composed of thin layers of metals and other materials and were designed to provide wavelength bandpasses in the 17 - 150 angstrom
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::04f1851e2f085f91f1afec0793327688
https://doi.org/10.1117/12.371077
https://doi.org/10.1117/12.371077
An electron spectrometer has been designed to measure electron flux in the range of 3 to 30 MeV. A breadboard unit was designed and tested, using a solid state detector telescope for geometric factor definition and a Cerenkov radiator/PMT for energy
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d96a4f4e6812547223057193c0e9c9a5
https://doi.org/10.21236/ada328471
https://doi.org/10.21236/ada328471
Publikováno v:
GOES-8 and Beyond.
The GOES-8 solar x-ray sensor (XRS) detects solar x-rays in two wavelength bands of approximately 0.5 to 3 angstrom and 1 to 8 angstrom. The XRS uses a dual ion chamber design with beryllium windows and Xenon or Argon gas fills to provide the x-ray d
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3d63f0a3b92009c44014c45ddfbe9db8
https://doi.org/10.1117/12.254082
https://doi.org/10.1117/12.254082
Autor:
Frederick A. Hanser, Paul R. Morel
Data analysis procedures for the PASP Plus Dosimeter SN/2 in the APEX spacecraft are given, including dead time corrections for high count rate periods. The SN/1 unit calibration data from the MIT Van de Graaff have been reduced to geometric factors,
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::052f19d22a3e4ac3561747d520a0b59f
https://doi.org/10.21236/ada311336
https://doi.org/10.21236/ada311336
Autor:
Frederick A. Hanser
Data analysis procedures for the CRESS payloads AFGL-701-2 Dosimeter and AFGL-701-4 HEEF have been developed. The 701-4 HEEF backup instrument response for electrons was measured extensively.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6db675b3e70fcb7f2c13ef12faecdf51
https://doi.org/10.21236/ada300569
https://doi.org/10.21236/ada300569
Autor:
Rodney Viereck, Frederick A. Hanser, John E Wise, J.L. Weaver, Richard Grubb, Charles M. Brown, Glenn E. Holland, Darrell L. Judge, J. F. Seely, Raj Korde
Publikováno v:
Applied Optics. 40:1623
The responsivity of an extreme-ultraviolet transmission grating spectrometer with silicon photodiode detectors was measured with synchrotron radiation. The spectrometer was designed to record the absolute radiation flux in a wavelength bandpass cente
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::453b34eee4403f1524c77a83ba338851
https://doi.org/10.1364/ao.40.001623
https://doi.org/10.1364/ao.40.001623
Autor:
Bach Sellers, Frederick A. Hanser
Publikováno v:
Review of Scientific Instruments. 45:226-231
A method for measuring the thickness of silicon detectors by x‐ray transmission is described. The method has been calibrated by using silicon disks of known thickness. Use of a 10 keV fluorescent Ge K x‐ray source excited by a 10 mCi 238Pu source
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::40501f2584393772aa16ff1ba8720cf1
https://doi.org/10.1063/1.1686594
https://doi.org/10.1063/1.1686594