Zobrazeno 1 - 10
of 10
pro vyhledávání: '"Frederic Brault"'
Autor:
Jaime Bravo, Philippe Morey-Chaisemartin, Lifu Chang, Eric Beisser, Frederic Brault, Joshua Zusman
Publikováno v:
DTCO and Computational Patterning II.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::997d9a3326b6c09a258fb151b44db75c
https://doi.org/10.1117/12.2657011
https://doi.org/10.1117/12.2657011
Autor:
Frederic Brault, Philippe Morey-Chaisemartin, Samuel Boret, Benedicte Bry, Ghislaine Castel, Antonio Marques, Julien Rouessard, Christelle Segur
Publikováno v:
Photomask Technology 2022.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e91b0c738164cc18d2761553a9f9b35c
https://doi.org/10.1117/12.2641690
https://doi.org/10.1117/12.2641690
Publikováno v:
Design-Process-Technology Co-optimization XV.
We propose a new method applied on Multi-Project Wafer (MPW) reticles to reduce thermal-mechanical stress. Wafer bumping processes generate residual thermal-mechanical stress, causing crack and delamination across wide regions on a wafer. In this pap
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::69d361e3d3dd5d5c8b0b574274c197aa
https://doi.org/10.1117/12.2583510
https://doi.org/10.1117/12.2583510
Publikováno v:
ISEEIE
Taking into account the constraints introduced by the advanced nodes in use nowadays, this paper describes a new methodology for dummy filling. Using a reliable grid-based engine, this new technique allows the complete customization of the dummy fill
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::10938be04fb88af57ccbd2421cda35ff
https://doi.org/10.1145/3459104.3459175
https://doi.org/10.1145/3459104.3459175
Publikováno v:
Photomask Technology 2019.
This paper addresses large dies stitching challenges. Stitching is a way to combine several shots "stitched together" to create a die larger than what can fit on a photomask. This technique that was originally dedicated to advanced research is now mo
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9ab39f28245926dd24957b3eccc97efa
https://doi.org/10.1117/12.2536739
https://doi.org/10.1117/12.2536739
Publikováno v:
SPIE Proceedings.
Advanced process photolithography masks require more and more controls for registration versus design and critical dimension uniformity (CDU). The distribution of the measurement points should be distributed all over the whole mask and may be denser
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ed30a167fc13baa7c4614aadd82278f9
https://doi.org/10.1117/12.2229185
https://doi.org/10.1117/12.2229185
Publikováno v:
International Journal of Parallel Programming
International Journal of Parallel Programming, Springer Verlag, 2012, ⟨10.1007/s10766-012-0203-z⟩
International Journal of Parallel Programming, 2012, ⟨10.1007/s10766-012-0203-z⟩
International Journal of Parallel Programming, Springer Verlag, 2012, ⟨10.1007/s10766-012-0203-z⟩
International Journal of Parallel Programming, 2012, ⟨10.1007/s10766-012-0203-z⟩
International audience; We address the problem of generating compact code from software pipelined loops. Although software pipelining is a powerful technique to extract fine- grain parallelism, it generates lifetime intervals spanning multiple loop i
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::606ed84b492694b7b86e4a5b5ee87caf
https://hal.inria.fr/hal-00764521
https://hal.inria.fr/hal-00764521
Publikováno v:
ACM Transactions on Embedded Computing Systems (TECS)
ACM Transactions on Embedded Computing Systems (TECS), ACM, 2011, 10 (4), pp.25. ⟨10.1145/2043662.2043671⟩
ACM Transactions on Embedded Computing Systems (TECS), 2011, 10 (4), pp.25. ⟨10.1145/2043662.2043671⟩
ACM Transactions on Embedded Computing Systems (TECS), ACM, 2011, 10 (4), pp.25. ⟨10.1145/2043662.2043671⟩
ACM Transactions on Embedded Computing Systems (TECS), 2011, 10 (4), pp.25. ⟨10.1145/2043662.2043671⟩
Integrating register allocation and software pipelining of loops is an active research area. We focus on techniques that precondition the dependence graph before software pipelining in order to ensure that no register spill instructions are inserted
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::a8d48fa138c3f953295ca2162450bd04
https://hal.inria.fr/hal-00648176/file/Efficient_Spilling_Reduction.pdf
https://hal.inria.fr/hal-00648176/file/Efficient_Spilling_Reduction.pdf
Publikováno v:
HPCS 2011-International Conference on High Performance Computing Simulation
HPCS 2011-International Conference on High Performance Computing Simulation, Jul 2011, Istanbul, Turkey. ⟨10.1109/HPCSim.2011.5999826⟩
HPCS
HPCS 2011-International Conference on High Performance Computing Simulation, Jul 2011, Istanbul, Turkey. ⟨10.1109/HPCSim.2011.5999826⟩
HPCS
International audience; Modulo Variable Expansion (MVE) [1] used with soft- ware pipelining (SWP) may sacrifice the register optimality (MAXLIVE) and in general may lead to unnecessary spills or move operations negating the benefits of SWP. In con- t
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::3d3754539c853e07b19d79d75c6ad4e9
https://hal.inria.fr/hal-00699588/document
https://hal.inria.fr/hal-00699588/document
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