Zobrazeno 1 - 10
of 97
pro vyhledávání: '"Fred Bijkerk"'
Autor:
Seda Kizir, Wesley T. E. van den Beld, Bart Schurink, Robbert W. E. van de Kruijs, Jos P. H. Benschop, Fred Bijkerk
Publikováno v:
Scientific Reports, Vol 11, Iss 1, Pp 1-8 (2021)
Abstract The role of the Mo2C/oxide interface on multi-layer graphene (MLG) nucleation during a chemical vapor deposition (CVD) process is investigated. During the CVD process, MLG growth is only observed in the presence of a Mo2C/SiO2 interface, ind
Externí odkaz:
https://doaj.org/article/d5a54b7e44944ef6b8e597cf16f121db
Autor:
Anuj Chopra, Muharrem Bayraktar, Maarten Nijland, Johan E. ten Elshof, Fred Bijkerk, Guus Rijnders
Publikováno v:
Scientific Reports, Vol 7, Iss 1, Pp 1-9 (2017)
Renewed interest has been witnessed in utilizing the piezoelectric response of PbZr0.52Ti0.48O3 (PZT) films on glass substrates for applications such as adaptive optics. Accordingly, new methodologies are being explored to grow well-oriented PZT thin
Externí odkaz:
https://doaj.org/article/f56610bbb9ae4ff287aaabaab9e04126
Autor:
Anuj Chopra, Muharrem Bayraktar, Maarten Nijland, Johan E. ten Elshof, Fred Bijkerk, Guus Rijnders
Publikováno v:
AIP Advances, Vol 6, Iss 12, Pp 125209-125209-6 (2016)
Fatigue behavior of Pb(Zr,Ti)O3 (PZT) films is one of the deterrent factors that limits the use of these films in technological applications. Thus, understanding and minimization of the fatigue behavior is highly beneficial for fabricating reliable d
Externí odkaz:
https://doaj.org/article/5d83c10578c84d1f83a88e7fa054c32f
Autor:
Robert van der Meer, Igor Kozhevnikov, Balachander Krishnan, Jurriaan Huskens, Petra Hegeman, Christian Brons, Boris Vratzov, Bert Bastiaens, Klaus Boller, Fred Bijkerk
Publikováno v:
AIP Advances, Vol 3, Iss 1, Pp 012103-012103 (2013)
We demonstrate single-order operation of Lamellar Multilayer Gratings in the soft x-ray spectral range. The spectral resolution was found to be 3.8 times higher than from an unpatterned multilayer mirror, while there were no significant spectral side
Externí odkaz:
https://doaj.org/article/411d43f00e8f43e8a206704d584b3803
Autor:
Philip Lucke, Mohammadreza Nematollahi, Muharrem Bayraktar, Andrey E. Yakshin, Johan E. ten Elshof, Fred Bijkerk
Publikováno v:
ACS Omega, 7(26), 22210-22220. American Chemical Society
ACS Omega, 7(26), 1110-2220. American Chemical Society
ACS Omega, 7(26), 1110-2220. American Chemical Society
The microstructure of the PbZr0.52Ti0.48O3 (PZT) films is known to influence the ferroelectric properties, but so far mainly the effect of the deposition conditions of the PZT has been investigated. To our knowledge, the influence of the underlying e
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::774d602b3712e649369019aaa43e07fa
https://doi.org/10.1021/acsomega.2c00815
https://doi.org/10.1021/acsomega.2c00815
Autor:
Parikshit Phadke, Andrey A. Zameshin, Jacobus M. Sturm, Robbert W.E. van de Kruijs, Fred Bijkerk
Publikováno v:
Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, 520, 29-39. Elsevier
Semi-empirical formulae like the Yamamura model provide a quick reference of sputter yields for applications such as sputter depth profiling and secondary ion mass spectrometry. Fit parameters in such models are prone to errors which can propagate in
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::62a137e6ff9161f94d083bcfafff344f
http://www.scopus.com/inward/record.url?scp=85128149340&partnerID=8YFLogxK
http://www.scopus.com/inward/record.url?scp=85128149340&partnerID=8YFLogxK
Autor:
Juequan Chen, Eric Louis, Rob Harmsen, Tim Tsarfati, Herbert Wormeester, Maarten van Kampen, Willem van Schaik, Robbert van de Kruijs, Fred Bijkerk
Publikováno v:
Applied Surface Science. 618:155765
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d00742c6a52edf8606525b5622d002cb
https://doi.org/10.1016/j.apsusc.2022.155765
https://doi.org/10.1016/j.apsusc.2022.155765
Autor:
Bart Schurink, Wesley T. E. van den Beld, Roald M. Tiggelaar, Robbert W. E. van de Kruijs, Fred Bijkerk
Publikováno v:
Coatings; Volume 12; Issue 5; Pages: 685
Coatings, 12(5):685. MDPI
Coatings, 12(5):685. MDPI
Boron as thin film material is of relevance for use in modern micro- and nano-fabrication technology. In this research boron thin films are realized by a number of physical and chemical deposition methods, including magnetron sputtering, electron-bea
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::0bf5ca675d748094b0b9e5f8c25972a7
Autor:
Jos Benschop, Wesley van Beld den, Silvester Houweling, Airat Shafikov, Fred Bijkerk, Robbert Wilhelmus Elisabeth van de Kruijs
Publikováno v:
Journal of microelectromechanical systems, 31(1), 63-73. IEEE
In this work, we experimentally measure fracture toughness of free-standing zirconium ZrSiₓ thin films using the crack-on-a-chip method. In this method, fracture toughness is determined from the analysis of cracks, which propagate and arrest in spe
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::52dedd643d76ee303873cdbf13d5b532
https://research.utwente.nl/en/publications/f2661099-289a-427c-b643-bd7eae39f453
https://research.utwente.nl/en/publications/f2661099-289a-427c-b643-bd7eae39f453
Autor:
Fred Bijkerk, Jacobus Marinus Sturm, Wesley T. E. van den Beld, Cristiane R. Stilhano Vilas Boas
Publikováno v:
Materialia, 20:101203. Elsevier
In this work we analyze the oxidation of 30 nm polycrystalline transition metals films (Hf, Ta, Mo and Ru) at low temperatures (298 K to 473 K) upon the exposure to two different species: molecular oxygen and atomic oxygen. Using in-situ spectroscopi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::33af4a4321b701cbe8d295f6e1203c73
https://doi.org/10.1016/j.mtla.2021.101203
https://doi.org/10.1016/j.mtla.2021.101203