Zobrazeno 1 - 10
of 163
pro vyhledávání: '"Fred A. Stevie"'
Publikováno v:
Journal of Vacuum Science & Technology B. 41
Detection of surface contamination on niobium materials used in superconducting radio frequency (SRF) applications is difficult due to quantitative sensitivity and near-atomic depth resolution needed. Inspection of samples known to have experienced s
Publikováno v:
PLoS ONE, Vol 13, Iss 12, p e0209119 (2018)
Time-of-flight secondary ion mass spectrometry (ToF-SIMS) analysis was used to qualitatively and quantitatively assess the distribution of permethrin insecticide on the surfaces and interiors of Olyset long-lasting insecticidal net (LLIN) fibers. Tot
Externí odkaz:
https://doaj.org/article/b0d7f68bfef84e16a887dc9df649bc1a
Autor:
Surya Nalamati, Fred A. Stevie, Keith Jones, Shanthi Iyer, Rabin Pokharel, Lew Reynolds, Priyanka Ramaswamy, Shisir Devkota
Publikováno v:
Scientific Reports
Scientific Reports, Vol 11, Iss 1, Pp 1-14 (2021)
Scientific Reports, Vol 11, Iss 1, Pp 1-14 (2021)
We report the first study on doping assessment in Te-doped GaAsSb nanowires (NWs) with variation in Gallium Telluride (GaTe) cell temperature, using X-ray photoelectron spectroscopy (XPS), ultraviolet photoelectron spectroscopy (UPS), conductive-atom
Autor:
Jonathan W. Angle, Eric M. Lechner, Ari D. Palczewski, Charles E. Reece, Fred A. Stevie, Michael J. Kelley
Publikováno v:
Journal of Vacuum Science & Technology B. 40:024003
The importance of SIMS analyses for “N-doped” impurity alloyed niobium and other surface-alloyed materials continues to increase. A major hurdle is the uncertainty of instrument calibration due to changes in sample height either from sample surfa
Publikováno v:
Journal of Vacuum Science & Technology B. 40:014002
Publikováno v:
Analytical Methods. 10:2444-2449
Time-of-flight secondary ion mass spectrometry is a widely used surface analytical technique, which can provide chemical information from both the uppermost surface and underneath the surface for various materials. For identification of the structure
Publikováno v:
Journal of Vacuum Science & Technology B. 39:024004
Accurate secondary ion mass spectroscopy measurement of nitrogen in niobium relies on the use of closely equivalent standards, made by ion implantation, to convert nitrogen signal intensity to nitrogen content by determination of relative sensitivity
Autor:
Fred A. Stevie, Carrie L. Donley
Publikováno v:
Journal of Vacuum Science & Technology A. 38:063204
X-ray photoelectron spectroscopy (XPS) has become one of the most widely used surface analysis techniques, and XPS instrumentation has become more user friendly, making the technique available to a large number of researchers. The number of experts i
Publikováno v:
Journal of Vacuum Science & Technology A. 38:063202
Sample preparation and mounting are important aspects of x-ray photoelectron spectroscopy (XPS) analysis. New users do not know many techniques that are familiar to analysts with years of experience, and these observations and “tricks of the trade
Autor:
Fred A. Stevie
Publikováno v:
Surface and Interface Analysis. 48:310-314
Hydrogen is a very important element but analysis of hydrogen in solids can be difficult and is not available for many analytical techniques. This paper provides an overview of the capabilities of SIMS and NRA to measure hydrogen concentrations and d