Zobrazeno 1 - 5
of 5
pro vyhledávání: '"Franziska Stadlbauer"'
Autor:
Armin Holzner, Thomas Koch, Vasiliki-Maria Archodoulaki, Florian Planitzer, Franziska Stadlbauer, Wolfgang Fidi
Publikováno v:
Materials, Vol 6, Iss 12, Pp 5502-5516 (2013)
Materials
Materials; Volume 6; Issue 12; Pages: 5502-5516
Materials
Materials; Volume 6; Issue 12; Pages: 5502-5516
Loading parameters (frequency, amplitude ratio and waveform) are varied to determine their influence on fatigue crack growth in rubber. Up to three different rubber blends are investigated: one actual engineering material and two model materials. Fat
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::4eeb60542f2408d5db693ac864297e1a
http://www.mdpi.com/1996-1944/6/12/5502
http://www.mdpi.com/1996-1944/6/12/5502
Autor:
Wolfgang Fidi, Franziska Stadlbauer, Vasiliki-Maria Archodoulaki, Florian Planitzer, Thomas Koch
Publikováno v:
Polymer Testing. 32:1045-1051
A novel measurement setup is developed to determine fatigue crack growth and heat build-up in rubber. Loading conditions include tensile and compressional loads. Deviations in the crack shape are detected with special features (swivel arm and additio
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::08b607cc4ded5b320c39fedbb3482e10
https://doi.org/10.1016/j.polymertesting.2013.06.003
https://doi.org/10.1016/j.polymertesting.2013.06.003
Autor:
Franziska Stadlbauer, Christina Streli, A. Wastl, J. Prost, C. Horntrich, Peter Wobrauschek, Peter Kregsamer
Publikováno v:
Spectrochimica Acta Part B: Atomic Spectroscopy. 82:71-75
A nanoliter droplet deposition unit was developed and characterized for application of sample preparation in TXRF. The droplets produced on quartz reflectors as well as on wafers show a good reproducibility, also the accuracy of the pipetted volume c
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::17ade6c284d60e52bc142766e0eecbbb
https://doi.org/10.1016/j.sab.2013.01.006
https://doi.org/10.1016/j.sab.2013.01.006
Autor:
Christina Streli, Peter Kregsamer, Franziska Stadlbauer, C. Horntrich, J. Prost, Peter Wobrauschek
Publikováno v:
Spectrochimica Acta Part B: Atomic Spectroscopy. 77:31-34
Total Reflection X-ray Fluorescence analysis (TXRF) is a well-established analytical method in the semiconductor industry for the analysis of silicon wafer surfaces. For the calibration of the spectrometer typically an external standard is used which
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e653b0f2f253c3887f5262b065321d30
https://doi.org/10.1016/j.sab.2012.07.026
https://doi.org/10.1016/j.sab.2012.07.026
Autor:
Stefan Merz, Georg Steinhauser, Franziska Stadlbauer, Peter Kregsamer, Christina Streli, Mario Villa
Publikováno v:
Gold Bulletin. 45:17-22
In two test series, liquid and solid gold-based neutron flux monitor materials were investigated with respect to the effects of neutron absorbers such as chlorine, scattering effects, and the dependence of the enhanced activation caused by the epithe
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::b79dc0ad247b3da69905ee68a2454378
https://doi.org/10.1007/s13404-011-0039-0
https://doi.org/10.1007/s13404-011-0039-0